High precision planar waveguide propagation loss measurement technique using a Fabry-Perot cavity

Publication: Research - peer-reviewJournal article – Annual report year: 1994

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High precision planar waveguide propagation loss measurement technique using a Fabry-Perot cavity. / Feuchter, Thomas; Thirstrup, Carsten.

In: I E E E Photonics Technology Letters, Vol. 6, No. 10, 1994, p. 1244-1247.

Publication: Research - peer-reviewJournal article – Annual report year: 1994

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Feuchter, Thomas; Thirstrup, Carsten / High precision planar waveguide propagation loss measurement technique using a Fabry-Perot cavity.

In: I E E E Photonics Technology Letters, Vol. 6, No. 10, 1994, p. 1244-1247.

Publication: Research - peer-reviewJournal article – Annual report year: 1994

Bibtex

@article{49261ec0637e438a8754988c0c95a0a0,
title = "High precision planar waveguide propagation loss measurement technique using a Fabry-Perot cavity",
publisher = "I E E E",
author = "Thomas Feuchter and Carsten Thirstrup",
note = "Copyright: 1994 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE",
year = "1994",
doi = "10.1109/68.329652",
volume = "6",
number = "10",
pages = "1244--1247",
journal = "I E E E Photonics Technology Letters",
issn = "1041-1135",

}

RIS

TY - JOUR

T1 - High precision planar waveguide propagation loss measurement technique using a Fabry-Perot cavity

A1 - Feuchter,Thomas

A1 - Thirstrup,Carsten

AU - Feuchter,Thomas

AU - Thirstrup,Carsten

PB - I E E E

PY - 1994

Y1 - 1994

N2 - A high precision measurement technique for characterizing the propagation loss in silica low-loss optical waveguides, based on measuring the contrast of a Fabry-Perot cavity, is demonstrated. The cavity consists of the waveguide coupled to two polarization-maintaining fibers, each end facet coated with dielectric mirrors, leaving the reflectivity as an adjustable parameter. The contrast is measured by modulating the cavity length without influence on the waveguide characteristics and the coupling efficiency. A double modulation of the cavity length reduces the measurement uncertainty, and provides a measurement precision better than 0.1 dB, corresponding to 0.02 dB/cm in case of a 5 cm long waveguide

AB - A high precision measurement technique for characterizing the propagation loss in silica low-loss optical waveguides, based on measuring the contrast of a Fabry-Perot cavity, is demonstrated. The cavity consists of the waveguide coupled to two polarization-maintaining fibers, each end facet coated with dielectric mirrors, leaving the reflectivity as an adjustable parameter. The contrast is measured by modulating the cavity length without influence on the waveguide characteristics and the coupling efficiency. A double modulation of the cavity length reduces the measurement uncertainty, and provides a measurement precision better than 0.1 dB, corresponding to 0.02 dB/cm in case of a 5 cm long waveguide

U2 - 10.1109/68.329652

DO - 10.1109/68.329652

JO - I E E E Photonics Technology Letters

JF - I E E E Photonics Technology Letters

SN - 1041-1135

IS - 10

VL - 6

SP - 1244

EP - 1247

ER -