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@article{39528701e9884a869aa1f1deed1de31f,
title = "High mass resolution time of flight mass spectrometer for measuring products in heterogeneous catalysis in highly sensitive microreactors.",
publisher = "American Institute of Physics",
author = "Thomas Andersen and Robert Jensen and Christensen, {M. K.} and Thomas Pedersen and Ole Hansen and I Chorkendorff",
note = "© 2012 American Institute of Physics",
year = "2012",
doi = "10.1063/1.4732815",
volume = "83",
number = "7",
journal = "Review of Scientific Instruments",
issn = "0034-6748",

}

RIS

TY - JOUR

T1 - High mass resolution time of flight mass spectrometer for measuring products in heterogeneous catalysis in highly sensitive microreactors.

A1 - Andersen,Thomas

A1 - Jensen,Robert

A1 - Christensen,M. K.

A1 - Pedersen,Thomas

A1 - Hansen,Ole

A1 - Chorkendorff,I

AU - Andersen,Thomas

AU - Jensen,Robert

AU - Christensen,M. K.

AU - Pedersen,Thomas

AU - Hansen,Ole

AU - Chorkendorff,I

PB - American Institute of Physics

PY - 2012

Y1 - 2012

N2 - <p>We demonstrate a combined microreactor and time of flight system for testing and characterization of heterogeneous catalysts with high resolution mass spectrometry and high sensitivity. Catalyst testing is performed in silicon-based microreactors which have high sensitivity and fast thermal response. Gas analysis is performed with a time of flight mass spectrometer with a modified nude Bayard-Alpert ionization gauge as gas ionization source. The mass resolution of the time of flight mass spectrometer using the ion gauge as ionization source is estimated to m∕Δm &gt; 2500. The system design is superior to conventional batch and flow reactors with accompanying product detection by quadrupole mass spectrometry or gas chromatography not only due to the high sensitivity, fast temperature response, high mass resolution, and fast acquisition time of mass spectra but it also allows wide mass range (0-5000 amu in the current configuration). As a demonstration of the system performance we present data from ammonia oxidation on a Pt thin film showing resolved spectra of OH and NH<sub>3</sub></p>

AB - <p>We demonstrate a combined microreactor and time of flight system for testing and characterization of heterogeneous catalysts with high resolution mass spectrometry and high sensitivity. Catalyst testing is performed in silicon-based microreactors which have high sensitivity and fast thermal response. Gas analysis is performed with a time of flight mass spectrometer with a modified nude Bayard-Alpert ionization gauge as gas ionization source. The mass resolution of the time of flight mass spectrometer using the ion gauge as ionization source is estimated to m∕Δm &gt; 2500. The system design is superior to conventional batch and flow reactors with accompanying product detection by quadrupole mass spectrometry or gas chromatography not only due to the high sensitivity, fast temperature response, high mass resolution, and fast acquisition time of mass spectra but it also allows wide mass range (0-5000 amu in the current configuration). As a demonstration of the system performance we present data from ammonia oxidation on a Pt thin film showing resolved spectra of OH and NH<sub>3</sub></p>

UR - http://www.aip.org/

U2 - 10.1063/1.4732815

DO - 10.1063/1.4732815

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

SN - 0034-6748

IS - 7

VL - 83

ER -