Fast, versatile, and non-destructive biscuit inspection system using spectral imaging

Publication: Research - peer-reviewArticle in proceedings – Annual report year: 2017

DOI

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A fast, versatile, and non-destructive method for assessing biscuit quality is presented. The method integrates color (or browning) measurement, moisture assessment, compositional and dimensional measurements on a spectral imaging platform using the silicon range 400–1000 nm.
Original languageEnglish
Title of host publicationProceedings of 2017 Fifteenth IAPR International Conference on Machine Vision Applications
PublisherIEEE
Publication date2017
Pages502-505
ISBN (print)978-4-9011-2216-0
DOIs
StatePublished - 2017
Event2017 Fifteenth IAPR International Conference on Machine Vision Applications - Nagoya, Japan

Conference

Conference2017 Fifteenth IAPR International Conference on Machine Vision Applications
LocationNagoya University
CountryJapan
CityNagoya
Period08/05/201712/05/2017
Series2017 Fifteenth Iapr International Conference on Machine Vision Applications (mva)
CitationsWeb of Science® Times Cited: No match on DOI
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