Fast and direct measurements of the electrical properties of graphene using micro four-point probes

Publication: Research - peer-reviewJournal article – Annual report year: 2011

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We present measurements of the electronic properties of graphene using a repositionable micro four-point probe system, which we show here to have unique advantages over measurements made on lithographically defined devices; namely speed, simplicity and lack of a need to pattern graphene. Measurements are performed in ambient, vacuum and controlled environmental conditions using an environmental scanning electron microscope (SEM). The results are comparable to previous results for microcleaved graphene on silicon dioxide (SiO2). We observe a pronounced hysteresis of the charge neutrality point, dependent on the sweep rate of the gate voltage; and environmental measurements provide insight into the sensor application prospects of graphene. The method offers a fast, local and non-destructive technique for electronic measurements on graphene, which can be positioned freely on a graphene flake.
Original languageEnglish
JournalNanotechnology
Publication date2011
Volume22
Issue44
Pages445702
ISSN09574484
DOIs
StatePublished
CitationsWeb of Science® Times Cited: 10

Keywords

  • Condensed matter: structural, mechanical & thermal, Condensed matter: Condensed matter, Surfaces, interfaces and thin films
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