Enhancement of Electroluminescence (EL) image measurements for failure quantification methods

Research output: Research - peer-reviewArticle in proceedings – Annual report year: 2018

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Good quality images are necessary for electroluminescence (EL) image analysis and failure quantification in solar panels. In this work, a method for determining image quality in terms of more accurate failure detection in PV panels through EL imaging is proposed. The goal of the paper is to highlight the different methods for image quality improvement and to determine if the enhanced image provides more useful diagnostic information for accurate micro cracks and fracture detection. From the work carried out in this paper, it is to be noted that averaging technique helps in improving the SNR value. Additionally, subtracting the background from the obtained averaged EL image proves to be an enhancing method for cell fracture identification and more number of edges are also detected which can be useful for micro
crack quantification.
Original languageEnglish
Title of host publicationProceedings of 7th World Conference on Photovoltaic Energy Conversion
Number of pages6
PublisherIEEE
Publication date2018
StatePublished - 2018
Event7th World Conference on Photovoltaic Energy Conversion - Hilton Waikoloa Village Resort, Waikoloa, United States
Duration: 10 Jun 201815 Jun 2018
Conference number: WCPEC-7

Conference

Conference7th World Conference on Photovoltaic Energy Conversion
NumberWCPEC-7
LocationHilton Waikoloa Village Resort
CountryUnited States
CityWaikoloa
Period10/06/201815/06/2018
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