Effects of current stress and thermal storage on polymeric heterojunction P3HT:PCBM solar cell

Publication: Research - peer-reviewArticle in proceedings – Annual report year: 2016

DOI

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We subjected P3HT:PCBM solar cells to electrical constant current stress and thermal storage. We employed the impedance spectroscopy technique combined to conventional DC measurements for device characterization during all stresses. We identified and separated different contributions affecting the open circuit voltage and short circuit current. Several mechanisms are behind these changes during the stresses; in particular, we underlined the exciton recombination rate and the variation of the built-in voltage.
Original languageEnglish
Title of host publication2016 International Reliability Physics Symposium (IRPS)
Number of pages6
PublisherIEEE
Publication date2016
ISBN (print)978-1-4673-9138-2
ISBN (electronic)978-1-4673-9137-5
DOIs
StatePublished - 2016
Event2016 IEEE International Reliability Physics Symposium - Pasadena, United States

Conference

Conference2016 IEEE International Reliability Physics Symposium
CountryUnited States
CityPasadena
Period17/04/201621/04/2016
Internet address
SeriesI E E E International Reliability Physics Symposium. Proceedings
ISSN1541-7026
CitationsWeb of Science® Times Cited: No match on DOI

    Keywords

  • Stress, Solar cell, Heterojunctions, Current, Thermal stability
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