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Nanocrystalline Ni thin films have been produced by direct current electrodeposition with different additives and current density in order to obtain 〈100〉, 〈111〉 and 〈211〉 major fiber textures. The dislocation density, the Burgers vector population and the coherently scattering domain size distribution are determined by high-resolution X-ray diffraction line profile analysis. The substructure parameters are correlated with the strength of the films by using the combined Taylor and Hall-Petch relations. The convolutional multiple whole profile method is used to obtain the substructure parameters in the different coexisting texture components. A strong variation of the dislocation density is observed as a function of the deposition conditions.
Original languageEnglish
JournalJournal of Applied Crystallography
Publication date2012
Volume45
Issue1
Pages61-70
ISSN0021-8898
DOIs
StatePublished
CitationsWeb of Science® Times Cited: 2

Keywords

  • Burgers vector population, Nanocrystalline Ni films, X-ray line profile analysis, Dislocation densities
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