Discrete Tomography and Imaging of Polycrystalline Structures

Publication: ResearchPaper – Annual report year: 2009

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High resolution transmission electron microscopy is commonly considered as the standard application for discrete tomography. While this has yet to be technically realized, new applications with a similar flavor have emerged in materials science. In our group at Ris� DTU (Denmark's National Laboratory for Sustainable Energy), for instance, we study polycrystalline materials via synchrotron X-ray diffraction. Several reconstruction problems arise, most of them exhibit inherently discrete aspects. In this talk I want to give a concise mathematical introduction to some of these reconstruction problems. Special focus is on their relationship to classical discrete tomography. Several open mathematical questions will be mentioned along the way.
Original languageEnglish
Publication date2009
StatePublished

Conference

ConferenceMeeting on Tomography and Applications to Image Reconstruction
CountryItaly
CityMilano
Period26/03/0927/03/09

Keywords

  • Materials characterization and modelling, Materials research
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