Direct measurement of the charge distribution along a biased carbon nanotube bundle using electron holography

Publication: Research - peer-reviewJournal article – Annual report year: 2011

View graph of relations

Nanowires and nanotubes can be examined in the transmission electron microscope under an applied bias. Here we introduce a model-independent method, which allows the charge distribution along a nanowire or nanotube to be measured directly from the Laplacian of an electron holographic phase image. We present results from a biased bundle of carbon nanotubes, in which we show that the charge density increases linearly with distance from its base, reaching a value of ~0.8 electrons/nm near its tip.
Original languageEnglish
Article number243101
JournalApplied Physics Letters
Publication date2011
Volume98
Issue24
ISSN0003-6951
DOIs
StatePublished
CitationsWeb of Science® Times Cited: 4
Download as:
Download as PDF
Select render style:
APAAuthorCBEHarvardMLAStandardVancouverShortLong
PDF
Download as HTML
Select render style:
APAAuthorCBEHarvardMLAStandardVancouverShortLong
HTML
Download as Word
Select render style:
APAAuthorCBEHarvardMLAStandardVancouverShortLong
Word

Download statistics

No data available

ID: 5876614