TY - JOUR

T1 - Development of all chemical solution derived Ce0.9La0.1O2 − y/Gd2Zr2O7 buffer layer stack for coated conductors: influence of the post-annealing process on surface crystallinity

A1 - Yue,Zhao

A1 - Li,Xiaofen

A1 - Khoryushin,Alexey

A1 - He,Dong

A1 - Andersen,Niels Hessel

A1 - Hansen,Jørn Bindslev

A1 - Grivel,Jean-Claude

AU - Yue,Zhao

AU - Li,Xiaofen

AU - Khoryushin,Alexey

AU - He,Dong

AU - Andersen,Niels Hessel

AU - Hansen,Jørn Bindslev

AU - Grivel,Jean-Claude

PB - Institute of Physics Publishing

PY - 2012

Y1 - 2012

N2 - Preparation and characterization of a biaxially textured Gd2Zr2O7 and Ce0.9La0.1O2 − y (CLO, cap)/Gd2Zr2O7 (GZO, barrier) buffer layer stack by the metal–organic deposition route are reported. YBa2Cu3O7 − d (YBCO) superconductor films were deposited by the pulsed-laser deposition (PLD) technique to assess the efficiency of such a novel buffer layer stack. Biaxial texture quality and morphology of the buffer layers and the YBCO superconductor films were fully characterized. The surface crystallinity of the buffer layers is studied by the electron backscatter diffraction technique. It is revealed that post-annealing GZO films in 2% H2 in Ar is an effective way to improve the surface crystallinity. As a result, a highly textured CLO film can grow directly on the GZO film at a lower crystallization temperature. The critical current density of a YBCOPLD film is higher than 1 MA cm − 2 (@77 K, in self-field), demonstrating that the novel CLO/GZO stack is very promising for further development of low cost buffer layer architectures for coated conductors.

AB - Preparation and characterization of a biaxially textured Gd2Zr2O7 and Ce0.9La0.1O2 − y (CLO, cap)/Gd2Zr2O7 (GZO, barrier) buffer layer stack by the metal–organic deposition route are reported. YBa2Cu3O7 − d (YBCO) superconductor films were deposited by the pulsed-laser deposition (PLD) technique to assess the efficiency of such a novel buffer layer stack. Biaxial texture quality and morphology of the buffer layers and the YBCO superconductor films were fully characterized. The surface crystallinity of the buffer layers is studied by the electron backscatter diffraction technique. It is revealed that post-annealing GZO films in 2% H2 in Ar is an effective way to improve the surface crystallinity. As a result, a highly textured CLO film can grow directly on the GZO film at a lower crystallization temperature. The critical current density of a YBCOPLD film is higher than 1 MA cm − 2 (@77 K, in self-field), demonstrating that the novel CLO/GZO stack is very promising for further development of low cost buffer layer architectures for coated conductors.

U2 - 10.1088/0953-2048/25/1/015008

DO - 10.1088/0953-2048/25/1/015008

JO - Superconductor Science & Technology

JF - Superconductor Science & Technology

SN - 0953-2048

IS - 1

VL - 25

SP - 015008

ER -