Development and characterization of coatings on Silicon Pore Optics substrates for the ATHENA mission

Publication: Research - peer-reviewConference article – Annual report year: 2012

Standard

Development and characterization of coatings on Silicon Pore Optics substrates for the ATHENA mission. / Ferreira, Desiree Della Monica; Jakobsen, Anders Clemen; Christensen, Finn Erland; Shortt, Brian; Krumrey, Michael; Garnæs, Jøregen; Simonsen, Ronni B.

In: Proceedings of SPIE, the International Society for Optical Engineering, Vol. 8443, 2012, p. 84435E.

Publication: Research - peer-reviewConference article – Annual report year: 2012

Harvard

APA

CBE

MLA

Vancouver

Author

Ferreira, Desiree Della Monica; Jakobsen, Anders Clemen; Christensen, Finn Erland; Shortt, Brian; Krumrey, Michael; Garnæs, Jøregen; Simonsen, Ronni B. / Development and characterization of coatings on Silicon Pore Optics substrates for the ATHENA mission.

In: Proceedings of SPIE, the International Society for Optical Engineering, Vol. 8443, 2012, p. 84435E.

Publication: Research - peer-reviewConference article – Annual report year: 2012

Bibtex

@article{d20023fee498447290b7328ae1c94816,
title = "Development and characterization of coatings on Silicon Pore Optics substrates for the ATHENA mission",
publisher = "S P I E - International Society for Optical Engineering",
author = "Ferreira, {Desiree Della Monica} and Jakobsen, {Anders Clemen} and Christensen, {Finn Erland} and Brian Shortt and Michael Krumrey and Jøregen Garnæs and Simonsen, {Ronni B.}",
year = "2012",
doi = "10.1117/12.927290",
volume = "8443",
pages = "84435E",
journal = "Proceedings of SPIE, the International Society for Optical Engineering",
issn = "1605-7422",

}

RIS

TY - CONF

T1 - Development and characterization of coatings on Silicon Pore Optics substrates for the ATHENA mission

A1 - Ferreira,Desiree Della Monica

A1 - Jakobsen,Anders Clemen

A1 - Christensen,Finn Erland

A1 - Shortt,Brian

A1 - Krumrey,Michael

A1 - Garnæs,Jøregen

A1 - Simonsen,Ronni B.

AU - Ferreira,Desiree Della Monica

AU - Jakobsen,Anders Clemen

AU - Christensen,Finn Erland

AU - Shortt,Brian

AU - Krumrey,Michael

AU - Garnæs,Jøregen

AU - Simonsen,Ronni B.

PB - S P I E - International Society for Optical Engineering

PY - 2012

Y1 - 2012

N2 - We present description and results of the test campaign performed on Silicon Pore Optics (SPO) samples to be used on the ATHENA mission. We perform a pre-coating characterization of the substrates using Atomic Force Microscopy (AFM), X-ray Re ectometry (XRR) and scatter measurements. X-ray tests at DTU Space and correlation between measured roughness and pre-coating characterization are reported. For coating development, a layer of Cr was applied underneath the Ir/B4C bi-layer with the goal of reducing stress, and the use of N2 during the coating process was tested in order to reduce the surface roughness in the coatings. Both processes show promising results. Measurements of the coatings were carried out at the 8 keV X-ray facility at DTU Space and with synchrotron radiation in the laboratory of PTB at BESSY II to determine re ectivity at the grazing incidence angles and energies of ATHENA. Coating development also included a W/Si multilayer coating. We present preliminary results on X-ray Re ectometry and Cross-sectional Transmission Electron Microscopy (TEM) of the W/Si multilayer.

AB - We present description and results of the test campaign performed on Silicon Pore Optics (SPO) samples to be used on the ATHENA mission. We perform a pre-coating characterization of the substrates using Atomic Force Microscopy (AFM), X-ray Re ectometry (XRR) and scatter measurements. X-ray tests at DTU Space and correlation between measured roughness and pre-coating characterization are reported. For coating development, a layer of Cr was applied underneath the Ir/B4C bi-layer with the goal of reducing stress, and the use of N2 during the coating process was tested in order to reduce the surface roughness in the coatings. Both processes show promising results. Measurements of the coatings were carried out at the 8 keV X-ray facility at DTU Space and with synchrotron radiation in the laboratory of PTB at BESSY II to determine re ectivity at the grazing incidence angles and energies of ATHENA. Coating development also included a W/Si multilayer coating. We present preliminary results on X-ray Re ectometry and Cross-sectional Transmission Electron Microscopy (TEM) of the W/Si multilayer.

KW - X-rays

KW - ATHENA mission

KW - Coating optimization

KW - Multilayers

KW - Ray-tracing

UR - http://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=1361146

U2 - 10.1117/12.927290

DO - 10.1117/12.927290

JO - Proceedings of SPIE, the International Society for Optical Engineering

JF - Proceedings of SPIE, the International Society for Optical Engineering

SN - 1605-7422

VL - 8443

SP - 84435E

ER -