Design and performance verification of a wideband scalable dual-polarized probe for spherical near-field antenna measurements
Publication: Research - peer-review › Article in proceedings – Annual report year: 2012
A wideband scalable dual-polarized probe designed by the Electromagnetic Systems group at the Technical University of Denmark is presented. The design was scaled and two probes were manufactured for the frequency bands 1-3 GHz and 0.4-1.2 GHz. The results of the acceptance tests of the 0.4-1.2 GHz probe are briefly discussed. Since these probes represent so-called higher-order antennas, applicability of the recently developed higher-order probe correction technique  for these probes was investigated. Extensive tests were carried out for two representative antennas under test using the manufactured probes; the results of these tests are presented and discussed in details.
|Title of host publication||Proceedings of the 34th Annual Symposium of the Antenna Measurement Techniques Association|
|Number of pages||6|
|State||Published - 2012|
|Event||34th Annual Symposium of the Antenna Measurement Techniques Association - Bellevue, WA, United States|
|Conference||34th Annual Symposium of the Antenna Measurement Techniques Association|
|Period||21/10/2012 → 26/10/2012|
- Dual-Polarized Probe, Wideband Probe, Spherical Near-Field Measurements, Uncertainties
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