Design and performance verification of a wideband scalable dual-polarized probe for spherical near-field antenna measurements
Publication: Research - peer-review › Article in proceedings – Annual report year: 2012
A wideband scalable dual-polarized probe designed by the Electromagnetic Systems group at the Technical University of Denmark is presented. The design was scaled and two probes were manufactured for the frequency bands 1-3 GHz and 0.4-1.2 GHz. The results of the acceptance tests of the 0.4-1.2 GHz probe are briefly discussed. Since these probes represent so-called higher-order antennas, applicability of the recently developed higher-order probe correction technique [3] for these probes was investigated. Extensive tests were carried out for two representative antennas under test using the manufactured probes; the results of these tests are presented and discussed in details.
| Original language | English |
|---|---|
| Title | Proceedings of the 34th Annual Symposium of the Antenna Measurement Techniques Association |
| Number of pages | 6 |
| Publication date | 2012 |
| State | Published |
Conference
| Conference | 34th Annual Symposium of the Antenna Measurement Techniques Association |
|---|---|
| Country | United States |
| City | Bellevue, WA |
| Period | 21-10-12 → 26-10-12 |
Keywords
- Dual-Polarized Probe, Wideband Probe, Spherical Near-Field Measurements, Uncertainties
Loading map data...
ID: 51132188