Critical current density measurement of thin films by AC susceptibility based on the penetration parameter h

Publication: Research - peer-reviewJournal article – Annual report year: 2012

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@article{df532a6d073345c1b192901f12da32e9,
title = "Critical current density measurement of thin films by AC susceptibility based on the penetration parameter <em>h</em>",
publisher = "Elsevier BV North-Holland",
author = "Xiao-Fen Li and Jean-Claude Grivel and Abrahamsen, {Asger B.} and Andersen, {Niels Hessel}",
year = "2012",
doi = "10.1016/j.physc.2012.02.032",
volume = "477",
pages = "6--14",
journal = "Physica C: Superconductivity and its Applications",
issn = "0921-4534",

}

RIS

TY - JOUR

T1 - Critical current density measurement of thin films by AC susceptibility based on the penetration parameter <em>h</em>

A1 - Li,Xiao-Fen

A1 - Grivel,Jean-Claude

A1 - Abrahamsen,Asger B.

A1 - Andersen,Niels Hessel

AU - Li,Xiao-Fen

AU - Grivel,Jean-Claude

AU - Abrahamsen,Asger B.

AU - Andersen,Niels Hessel

PB - Elsevier BV North-Holland

PY - 2012

Y1 - 2012

N2 - We have numerically proved that the dependence of AC susceptibility χ of a E(J) power law superconducting thin disc on many parameters can be reduced to one penetration parameter h, with E the electric field and J the current density. Based on this result, we propose a way of measuring the critical current density Jc of superconducting thin films by AC susceptibility. Compared with the normally used method based on the peak of the imaginary part, our method uses a much larger range of the AC susceptibility curve, thus allowing determination of the temperature (T) dependence of Jc from a normally applied χ(T) measurement. A fitting equation Jc=1.9Ha∣χ′∣0.69/d, −0.4

AB - We have numerically proved that the dependence of AC susceptibility χ of a E(J) power law superconducting thin disc on many parameters can be reduced to one penetration parameter h, with E the electric field and J the current density. Based on this result, we propose a way of measuring the critical current density Jc of superconducting thin films by AC susceptibility. Compared with the normally used method based on the peak of the imaginary part, our method uses a much larger range of the AC susceptibility curve, thus allowing determination of the temperature (T) dependence of Jc from a normally applied χ(T) measurement. A fitting equation Jc=1.9Ha∣χ′∣0.69/d, −0.4

KW - Critical current density

KW - AC susceptibility

KW - Superconducting thin film

KW - London penetration depth

U2 - 10.1016/j.physc.2012.02.032

DO - 10.1016/j.physc.2012.02.032

JO - Physica C: Superconductivity and its Applications

JF - Physica C: Superconductivity and its Applications

SN - 0921-4534

VL - 477

SP - 6

EP - 14

ER -