Critical current density measurement of thin films by AC susceptibility based on the penetration parameter h
Publication: Research - peer-review › Journal article – Annual report year: 2012
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Critical current density measurement of thin films by AC susceptibility based on the penetration parameter h. / Li, Xiao-Fen; Grivel, Jean-Claude; Abrahamsen, Asger B.; Andersen, Niels Hessel.
In: Physica C: Superconductivity and its Applications, Vol. 477, 2012, p. 6-14.Publication: Research - peer-review › Journal article – Annual report year: 2012
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TY - JOUR
T1 - Critical current density measurement of thin films by AC susceptibility based on the penetration parameter <em>h</em>
A1 - Li,Xiao-Fen
A1 - Grivel,Jean-Claude
A1 - Abrahamsen,Asger B.
A1 - Andersen,Niels Hessel
AU - Li,Xiao-Fen
AU - Grivel,Jean-Claude
AU - Abrahamsen,Asger B.
AU - Andersen,Niels Hessel
PB - Elsevier BV North-Holland
PY - 2012
Y1 - 2012
N2 - We have numerically proved that the dependence of AC susceptibility χ of a E(J) power law superconducting thin disc on many parameters can be reduced to one penetration parameter h, with E the electric field and J the current density. Based on this result, we propose a way of measuring the critical current density Jc of superconducting thin films by AC susceptibility. Compared with the normally used method based on the peak of the imaginary part, our method uses a much larger range of the AC susceptibility curve, thus allowing determination of the temperature (T) dependence of Jc from a normally applied χ(T) measurement. A fitting equation Jc=1.9Ha∣χ′∣0.69/d, −0.4
AB - We have numerically proved that the dependence of AC susceptibility χ of a E(J) power law superconducting thin disc on many parameters can be reduced to one penetration parameter h, with E the electric field and J the current density. Based on this result, we propose a way of measuring the critical current density Jc of superconducting thin films by AC susceptibility. Compared with the normally used method based on the peak of the imaginary part, our method uses a much larger range of the AC susceptibility curve, thus allowing determination of the temperature (T) dependence of Jc from a normally applied χ(T) measurement. A fitting equation Jc=1.9Ha∣χ′∣0.69/d, −0.4
KW - Critical current density
KW - AC susceptibility
KW - Superconducting thin film
KW - London penetration depth
U2 - 10.1016/j.physc.2012.02.032
DO - 10.1016/j.physc.2012.02.032
JO - Physica C: Superconductivity and its Applications
JF - Physica C: Superconductivity and its Applications
SN - 0921-4534
VL - 477
SP - 6
EP - 14
ER -