Publication: Research - peer-review › Journal article – Annual report year: 2011
The paper gives a survey of the upcoming use of X-ray computed tomography (CT) for dimensional quality control purposes: i.e. for traceable measurement of dimensions of technical (mechanical) components and for tolerance verification of such components. It describes the basic principles of CT metrology, putting emphasis on issues as accuracy, traceability to the unit of length (the meter) and measurement uncertainty. It provides a state of the art (anno 2011) and application examples, showing the aptitude of CT metrology to: (i) check internal dimensions that cannot be measured using traditional coordinate measuring machines and (ii) combine dimensional quality control with material quality control in one single quality inspection run.
|Citations||Web of Science® Times Cited: 23|
- Quality control, Metrology, X-ray computed tomography (CT)