Color effects from scattering on random surface structures in dielectrics.

Publication: Research - peer-reviewJournal article – Annual report year: 2012



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We show that cheap large area color filters, based on surface scattering, can be fabricated in dielectric materials by replication of random structures in silicon. The specular transmittance of three different types of structures, corresponding to three different colors, have been characterized. The angle resolved scattering has been measured and compared to predictions based on the measured surface topography and by the use of non-paraxial scalar diffraction theory. From this it is shown that the color of the transmitted light can be predicted from the topography of the randomly textured surfaces.
Original languageEnglish
JournalOptics Express
Issue number4
Pages (from-to)4376-4381
StatePublished - 2012

Bibliographical note

This paper was published in Optics Express and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.

CitationsWeb of Science® Times Cited: 7
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