Characterization of large area nanostructured surfaces using AFM measurements

Publication: Research - peer-reviewArticle in proceedings – Annual report year: 2012

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A surface characterisation study has been developed to validate an innovative tool making solution for nano patterning large areas via anodizing of aluminium (Al) and subsequent nickel electroforming. A surface topography characterization through atomic force microscopy (AFM) indicated a decreased magnitude of the 3D surface amplitude parameters chosen for the analysis, when increasing the Al purity from 99,5% to 99,999%. AFM was then employed to evaluate the periodical arrangements of the nano structured cells. Image processing was used to estimate the average areas value, the height variation relative to an average plane and the coefficient of variation of the fitted features curvature radius.
Original languageEnglish
Title of host publicationProceedings of the 12th euspen International Conference
Number of pages4
PublisherEuropean Society for Precision Engineering and Nanotechnology
Publication date2012
StatePublished

Conference

ConferenceThe 12th euspen International Conference
CountrySweden
CityStockholm
Period04/06/1208/06/12
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