Publication: Research - peer-review › Conference abstract in journal – Annual report year: 2012
Within the last decade a number of x-ray diffraction methods have been presented for non-destructive 3D characterization of polycrystalline materials. 3DXRD  and Diffraction Contrast Tomography [2,3,4] are examples of such methods providing full spatial and crystallographic information of the individual grains. Both methods rely on specially designed high-resolution near-field detectors for acquire the shape of the illuminated grains, and therefore the spatial resolution is for both methods limited by the resolution of the detector, currently ~2 micrometers. Applying these methods using conventional far-field detectors provides information on centre of mass, crystallographic orientation and stress state of the individual grains , at the expense of high spatial resolution. However, far-field detectors have much higher efficiency than near-field detectors, and as such are suitable for dynamic studies requiring high temporal resolution and set-ups involving bulky sample environments (e.g. furnaces, stress-rigs etc.)
|Journal||Materials Science Forum|
|Conference||4th International Conference on Recrystallization and Grain Growth|
|Period||04-07-10 → 09-07-10|
|Citations||Web of Science® Times Cited: 0|
- MATERIALS, MATERIALS, METALLURGY, DIFFRACTION CONTRAST TOMOGRAPHY, POLYCRYSTALS
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