Boundary migration during recrystallization of heavily deformed pure nickel

Publication: Research - peer-reviewConference article – Annual report year: 2012

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Boundary migration during recrystallization of heavily deformed pure nickel. / Zhang, Yubin; Juul Jensen, Dorte; Godfrey, Andrew.

In: Materials Science Forum, Vol. 715-716, 2012, p. 329-332.

Publication: Research - peer-reviewConference article – Annual report year: 2012

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Author

Zhang, Yubin; Juul Jensen, Dorte; Godfrey, Andrew / Boundary migration during recrystallization of heavily deformed pure nickel.

In: Materials Science Forum, Vol. 715-716, 2012, p. 329-332.

Publication: Research - peer-reviewConference article – Annual report year: 2012

Bibtex

@article{c547cad0b9ee4d8e9a1ffe156610b233,
title = "Boundary migration during recrystallization of heavily deformed pure nickel",
keywords = "Boundary migration, Protrusions, Electron backscattered pattern (EBSP), Nickel",
publisher = "Trans Tech Publications Ltd.",
author = "Yubin Zhang and {Juul Jensen}, Dorte and Andrew Godfrey",
year = "2012",
doi = "10.4028/www.scientific.net/MSF.715-716.329",
volume = "715-716",
pages = "329--332",
journal = "Materials Science Forum",
issn = "0255-5476",

}

RIS

TY - CONF

T1 - Boundary migration during recrystallization of heavily deformed pure nickel

A1 - Zhang,Yubin

A1 - Juul Jensen,Dorte

A1 - Godfrey,Andrew

AU - Zhang,Yubin

AU - Juul Jensen,Dorte

AU - Godfrey,Andrew

PB - Trans Tech Publications Ltd.

PY - 2012

Y1 - 2012

N2 - The detailed microstructure in front of recrystallization boundaries and their migration during annealing were traced using ex-situ electron backscatter pattern maps of one and the same surface area taken after annealing. It is observed that many protrusions/detrusions form on the recrystallizing boundaries. During annealing, the recrystallization boundary segments migrate in a stop-go type of fashion, while protrusions and detrusions alternately form and disappear. The<br/>correlation between the protrusions/detrusions and the stop-go type of migration are briefly discussed.

AB - The detailed microstructure in front of recrystallization boundaries and their migration during annealing were traced using ex-situ electron backscatter pattern maps of one and the same surface area taken after annealing. It is observed that many protrusions/detrusions form on the recrystallizing boundaries. During annealing, the recrystallization boundary segments migrate in a stop-go type of fashion, while protrusions and detrusions alternately form and disappear. The<br/>correlation between the protrusions/detrusions and the stop-go type of migration are briefly discussed.

KW - Boundary migration

KW - Protrusions

KW - Electron backscattered pattern (EBSP)

KW - Nickel

U2 - 10.4028/www.scientific.net/MSF.715-716.329

DO - 10.4028/www.scientific.net/MSF.715-716.329

JO - Materials Science Forum

JF - Materials Science Forum

SN - 0255-5476

VL - 715-716

SP - 329

EP - 332

ER -