Boundary migration during recrystallization of heavily deformed pure nickel

Publication: Research - peer-reviewConference article – Annual report year: 2012

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The detailed microstructure in front of recrystallization boundaries and their migration during annealing were traced using ex-situ electron backscatter pattern maps of one and the same surface area taken after annealing. It is observed that many protrusions/detrusions form on the recrystallizing boundaries. During annealing, the recrystallization boundary segments migrate in a stop-go type of fashion, while protrusions and detrusions alternately form and disappear. The
correlation between the protrusions/detrusions and the stop-go type of migration are briefly discussed.
Original languageEnglish
JournalMaterials Science Forum
Publication date2012
Volume715-716
Pages329-332
ISSN0255-5476
DOIs
StatePublished

Conference

Conference4th International Conference on Recrystallization and Grain Growth
CountryUnited Kingdom
CitySheffield
Period04/07/1009/07/10
CitationsWeb of Science® Times Cited: 0

Keywords

  • Boundary migration, Protrusions, Electron backscattered pattern (EBSP), Nickel
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