Analysis of the LSM/YSZ interface on micro- and nano-scale by SEM, FIB/SEM and (S)TEM

Publication: Research - peer-reviewArticle in proceedings – Annual report year: 2008

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Original languageEnglish
Title of host publicationEMC 2008. Proceedings
EditorsS. Richter, A. Schwedt
Volume2
Place of publicationBerlin
PublisherSpringer
Publication date2008
Pages349-350
ISBN (print)978-3-540-85225-4
StatePublished

Conference

Conference14th European Microscopy Congress
Number14
CountryGermany
CityAachen
Period01/09/0805/09/08
Internet addresshttp://www.eurmicsoc.org/emc2008.html
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