Analysis of the LSM/YSZ interface on micro- and nano-scale by SEM, FIB/SEM and (S)TEM
Publication: Research - peer-review › Article in proceedings – Annual report year: 2008
| Original language | English |
|---|---|
| Title | EMC 2008. Proceedings |
| Editors | S. Richter, A. Schwedt |
| Volume | 2 |
| Place of publication | Berlin |
| Publisher | Springer |
| Publication date | 2008 |
| Pages | 349-350 |
| ISBN (print) | 978-3-540-85225-4 |
| State | Published |
Conference
| Conference | 14th European Microscopy Congress |
|---|---|
| Number | 14 |
| Country | Germany |
| City | Aachen |
| Period | 01-09-08 → 05-09-08 |
| Internet address | http://www.eurmicsoc.org/emc2008.html |
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