3D EBSD charactyerization of deformation structures in commercial purity aluminum
Publication: Research - peer-review › Journal article – Annual report year: 2010
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3D EBSD charactyerization of deformation structures in commercial purity aluminum. / Fengxiang, Lin; Godfrey, A.; Juul Jensen, Dorte; Winther, Grethe.
In: Materials Characterization, Vol. 61, No. 11, 2010, p. 1203-1210.Publication: Research - peer-review › Journal article – Annual report year: 2010
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TY - JOUR
T1 - 3D EBSD charactyerization of deformation structures in commercial purity aluminum
A1 - Fengxiang,Lin
A1 - Godfrey,A.
A1 - Juul Jensen,Dorte
A1 - Winther,Grethe
AU - Fengxiang,Lin
AU - Godfrey,A.
AU - Juul Jensen,Dorte
AU - Winther,Grethe
PB - Elsevier Inc.
PY - 2010
Y1 - 2010
N2 - A method to map the microstructure in deformed aluminum in three dimensions is presented. The method employs serial sectioning by mechanical polishing, and electropolishing to obtain a good surface quality, and orientation mapping of individual grains in each section by electron backscattered diffraction. Techniques to carefully align the sample and to accurately measure the thickness of the material removed in each serial section are described. A new method for stacking the two dimensional maps together to produce a three dimensional visualization of the microstructure is presented. The data are analyzed in terms of the deformation-induced orientation spread within each grain. In particular the advantage of using three dimensional data, as opposed to two dimensional data, is illustrated, by inclusion of information about the three dimensional morphology of a grain and its neighbors.
AB - A method to map the microstructure in deformed aluminum in three dimensions is presented. The method employs serial sectioning by mechanical polishing, and electropolishing to obtain a good surface quality, and orientation mapping of individual grains in each section by electron backscattered diffraction. Techniques to carefully align the sample and to accurately measure the thickness of the material removed in each serial section are described. A new method for stacking the two dimensional maps together to produce a three dimensional visualization of the microstructure is presented. The data are analyzed in terms of the deformation-induced orientation spread within each grain. In particular the advantage of using three dimensional data, as opposed to two dimensional data, is illustrated, by inclusion of information about the three dimensional morphology of a grain and its neighbors.
KW - Materials characterization and modelling
KW - Materials and energy storage
KW - Materialekarakterisering og materialemodellering
KW - Materialer og energilagring
U2 - 10.1016/j.matchar.2010.07.013
DO - 10.1016/j.matchar.2010.07.013
JO - Materials Characterization
JF - Materials Characterization
SN - 1044-5803
IS - 11
VL - 61
SP - 1203
EP - 1210
ER -