3D EBSD charactyerization of deformation structures in commercial purity aluminum

Publication: Research - peer-reviewJournal article – Annual report year: 2010

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3D EBSD charactyerization of deformation structures in commercial purity aluminum. / Fengxiang, Lin; Godfrey, A.; Juul Jensen, Dorte; Winther, Grethe.

In: Materials Characterization, Vol. 61, No. 11, 2010, p. 1203-1210.

Publication: Research - peer-reviewJournal article – Annual report year: 2010

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Author

Fengxiang, Lin; Godfrey, A.; Juul Jensen, Dorte; Winther, Grethe / 3D EBSD charactyerization of deformation structures in commercial purity aluminum.

In: Materials Characterization, Vol. 61, No. 11, 2010, p. 1203-1210.

Publication: Research - peer-reviewJournal article – Annual report year: 2010

Bibtex

@article{84a5f6af07364693bce6737450877dc8,
title = "3D EBSD charactyerization of deformation structures in commercial purity aluminum",
publisher = "Elsevier Inc.",
author = "Lin Fengxiang and A. Godfrey and {Juul Jensen}, Dorte and Grethe Winther",
year = "2010",
doi = "10.1016/j.matchar.2010.07.013",
volume = "61",
number = "11",
pages = "1203--1210",
journal = "Materials Characterization",
issn = "1044-5803",

}

RIS

TY - JOUR

T1 - 3D EBSD charactyerization of deformation structures in commercial purity aluminum

A1 - Fengxiang,Lin

A1 - Godfrey,A.

A1 - Juul Jensen,Dorte

A1 - Winther,Grethe

AU - Fengxiang,Lin

AU - Godfrey,A.

AU - Juul Jensen,Dorte

AU - Winther,Grethe

PB - Elsevier Inc.

PY - 2010

Y1 - 2010

N2 - A method to map the microstructure in deformed aluminum in three dimensions is presented. The method employs serial sectioning by mechanical polishing, and electropolishing to obtain a good surface quality, and orientation mapping of individual grains in each section by electron backscattered diffraction. Techniques to carefully align the sample and to accurately measure the thickness of the material removed in each serial section are described. A new method for stacking the two dimensional maps together to produce a three dimensional visualization of the microstructure is presented. The data are analyzed in terms of the deformation-induced orientation spread within each grain. In particular the advantage of using three dimensional data, as opposed to two dimensional data, is illustrated, by inclusion of information about the three dimensional morphology of a grain and its neighbors.

AB - A method to map the microstructure in deformed aluminum in three dimensions is presented. The method employs serial sectioning by mechanical polishing, and electropolishing to obtain a good surface quality, and orientation mapping of individual grains in each section by electron backscattered diffraction. Techniques to carefully align the sample and to accurately measure the thickness of the material removed in each serial section are described. A new method for stacking the two dimensional maps together to produce a three dimensional visualization of the microstructure is presented. The data are analyzed in terms of the deformation-induced orientation spread within each grain. In particular the advantage of using three dimensional data, as opposed to two dimensional data, is illustrated, by inclusion of information about the three dimensional morphology of a grain and its neighbors.

KW - Materials characterization and modelling

KW - Materials and energy storage

KW - Materialekarakterisering og materialemodellering

KW - Materialer og energilagring

U2 - 10.1016/j.matchar.2010.07.013

DO - 10.1016/j.matchar.2010.07.013

JO - Materials Characterization

JF - Materials Characterization

SN - 1044-5803

IS - 11

VL - 61

SP - 1203

EP - 1210

ER -