1/f Noise Characterization in CMOS Transistors in 0.13um Technology

Publication: Research - peer-reviewArticle in proceedings – Annual report year: 2006

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Original languageEnglish
TitleProceedings of the 24st Norchip Conference
Publication date2006
Pages81-84
StatePublished

Conference

Conference24th Norchip Conference
Number24
CountrySweden
CityLinköping
Period20/11/0621/11/06
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