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The project concerns improvement of calibration and correct images from a Scanning Probe Microscope (SPM). The SPM consists of a piezo tube on which the sample is mounted. The tube moves the sample underneath an ultrafine tip. The vertical movement of the tip is registered by a laser beam during scanning across the sample surface in either contact mode or tapping mode. From the vertical movement of the tip an image of the sample surface is recorded. The goal is to provide a better understanding of the movement and control of SPMs through mathematical modelling and to investigate the tip-sample interaction and its influence on the scanned image.
StatusCurrent
Period01/08/9731/07/00
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ID: 2226760