Steen Grüner Hanson
- 2008
- Published
Experimental demonstration of singular-optical colouring of regularly scattered white light. / Angelsky, O.V.; Hanson, Steen Grüner; Maksimyak, P.P.; Maksimyak, A.P.; Negrych, A.L.
In: European Optical Society. Journal. Rapid Publications, Vol. 3, 2008, p. article number 08029.Publication: Research - peer-review › Journal article – Annual report year: 2008
- Published
Experimental modeling for singular-optical coloring of regularly scattered white light. / Angelsky, O.V. (Invited author); Hanson, Steen Grüner (Invited author); Maksimyak, P.P. (Invited author); Maksimyak, A.P. (Invited author); Negrych, A.L. (Invited author).
2008. Abstract from 4. International conference ''Singular optics (optical vortices): Fundamentals and applications SO'2008'', Alushta (UA), 15-20 Sep, .Publication: Research › Conference abstract for conference – Annual report year: 2008
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Interferometric evaluation of angular displacement using phase retrieval. / Almoro, Percival; Pedrini, Giancarlo; Anand, Arun; Osten, Wolfgang; Hanson, Steen Grüner.
In: Optics Letters, Vol. 33, 2008, p. 2041-2043.Publication: Research - peer-review › Journal article – Annual report year: 2008
- Published
Investigation of a fast optical characterization method for micro-optical lenticular lens arrays. / Iversen, T.F.; Hanson, Steen Grüner.
In: Abstract book. London : Institute of Physics, 2008. p. 53-54.Publication: Research › Conference abstract in proceedings – Annual report year: 2008
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Measuring angular displacements using phase retrieval. / Almoro, Percival; Pedrini, Giancarlo; Anand, Arun; Osten, Wolfgang; Hanson, Steen Grüner.
In: Pisika, Vol. 2, No. 1, 2008, p. 11.Publication: Research - peer-review › Journal article – Annual report year: 2008
- Published
Optical vortex metrology: Are phase singularities foes or friends in optical metrology?. / Takeda, M. (Invited author); Wang, W. (Invited author); Hanson, Steen Grüner (Invited author); Miyamoto, Y. (Invited author).
In: Proceedings. Bellingham : SPIE - International Society for Optical Engineering, 2008. (SPIE Proceedings Series, 7008).Publication: Research - peer-review › Article in proceedings – Annual report year: 2008
- Published
Optical vortex metrology for nano and bio measurement. / Wang, W.; Hanson, Steen Grüner; Takeda, M.
In: Programme. Grasmere : The Optoelectronics Committee, 2008.Publication: Research › Conference abstract in proceedings – Annual report year: 2008
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Phase error correction in wavefront curvature sensing via phase retrieval. / Almoro, Percival; Hanson, Steen Grüner.
In: Interferometry 14: Applications. ed. / E. Novak; W. Osten; C. Gorecki. Bellingham : SPIE - International Society for Optical Engineering, 2008. p. Article number: 70640F (Proceedings of S P I E - International Society for Optical Engineering, Vol. 7064).Publication: Research - peer-review › Article in proceedings – Annual report year: 2008
- Published
Principles and applications of a speckle-based wavefront sensor. / Almoro, Percival; Hanson, Steen Grüner.
2008. Abstract from Danish Optical Society Annual Meeting 2008, Nyborg, Denmark.Publication: Research › Conference abstract for conference – Annual report year: 2008
- Published
Pseudo stokes vector correlation for micro-displacement measurement. / Wang, W.; Ishijima, R.; Matsuda, A.; Hanson, Steen Grüner; Takeda, M.
In: Book of abstracts. ed. / J. Huntley; M. Grédiac. Loughborough : Loughborough University, 2008.Publication: Research › Conference abstract in proceedings – Annual report year: 2008