• Published

  Anomalous activation of shallow B+ implants in Ge

  Publication: Research - peer-review › Journal article – Annual report year: 2011

• Published

  Electrical characterization of InGaAs ultra-shallow junctions

  Publication: Research - peer-review › Journal article – Annual report year: 2010

• Published

  Review of electrical characterization of ultra-shallow junctions with micro four-point probes

  Publication: Research - peer-review › Journal article – Annual report year: 2010

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• Journal of Vacuum Science and Technology. Part B. Microelectronics and Nanometer Structures

  ISSNs: 1071-1023

  American Institute of Physics, United States

  FI (2012): 1, ISI indexed (2012): yes

  Central database

  Journal

• Journal of Applied Physics

  ISSNs: 0021-8979

  American Institute of Physics, United States

  FI (2012): 1, ISI indexed (2012): yes

  Central database

  Journal

• Review of Scientific Instruments

  ISSNs: 0034-6748

  American Institute of Physics, United States

  FI (2012): 1, ISI indexed (2012): yes

  Central database

  Journal

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• Completed

  STM Study of Molecules on Semiconductor Surfaces

  Project: PhD

• Pergamon-elsevier Science Ltd

  Local database

  Publisher

• IEEE, 0-7803

  Central database

  Publisher