Peter Stanley Jørgensen is a Postdoc at the Technical University of Denmark. He is working with focused ion beam and scanning electron microscope imaging with a focus on microstructural analysis of electron microscope images in 2D and 3D. His core research interest is in computational methods for advanced analysis of microstructure in 2D and 3D.

CV

Education

1999 - 2006 M.Sc.(eng) - IMM, Technical University of Denmark

Academic grades

Ph.D.

Professional experience

2006 - 2007 research assistant (IMM) - Technical University of Denmark, Informatics and Mathematical Modelling.

Languages

Danish, English
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  • E C S Transactions

    ISSNs: 1938-5862

    Electrochemical Society, Inc., United States

    FI (2012): 1, ISI indexed (2012): no

    Central database

    Journal

  • Journal of Power Sources

    ISSNs: 0378-7753, 03787753

    Elsevier S.A., Switzerland

    FI (2012): 1, ISI indexed (2012): yes

    Central database

    Journal

  • Microscopy and Microanalysis

    ISSNs: 1431-9276

    Cambridge University Press, United Kingdom

    FI (2012): 1, ISI indexed (2012): yes

    Central database

    Journal

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