• Published

  Advanced characterization of carrier profiles in germanium using micro-machined contact probes

  Publication: Research - peer-review › Conference article – Annual report year: 2012

• Published

  Junction leakage measurements with micro four-point probes

  Publication: Research - peer-review › Conference article – Annual report year: 2012

• Published

  Advanced Characterization of Semiconductors using Microprobes

  Publication: Research › Ph.d. thesis – Annual report year: 2010

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• Journal of Vacuum Science and Technology. Part B. Microelectronics and Nanometer Structures

  ISSNs: 1071-1023

  American Institute of Physics, United States

  FI (2012): 1, ISI indexed (2012): yes

  Central database

  Journal

• A I P Conference Proceedings Series

  ISSNs: 0094-243X, 0094-243X, 0094243x

  Springer New York LLC, United States

  FI (2012): 1, ISI indexed (2012): no

  Central database

  Journal

• Review of Scientific Instruments

  ISSNs: 0034-6748

  American Institute of Physics, United States

  FI (2012): 1, ISI indexed (2012): yes

  Central database

  Journal

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• Advanced metrology for magnetic tunnel junctions

  Project: PhD

• Completed

  Advanced Characterization of Semiconductors using Microprobes

  Project: PhD

• Technical University of Denmark (DTU)

  Local database

  Publisher

• IEEE, 0-7803

  Central database

  Publisher