Peter Folmer Nielsen
Former employee
Publications
(12)- Published
Advanced characterization of carrier profiles in germanium using micro-machined contact probes
Publication: Research - peer-review › Conference article – Annual report year: 2012
- Published
Junction leakage measurements with micro four-point probes
Publication: Research - peer-review › Conference article – Annual report year: 2012
- Published
Advanced Characterization of Semiconductors using Microprobes
Publication: Research › Ph.d. thesis – Annual report year: 2010
Journal of Vacuum Science and Technology. Part B. Microelectronics and Nanometer Structures
ISSNs: 1071-1023
American Institute of Physics, United States
FI (2012): 1, ISI indexed (2012): yes
Central database
Journal
A I P Conference Proceedings Series
ISSNs: 0094-243X, 0094-243X, 0094243x
Springer New York LLC, United States
FI (2012): 1, ISI indexed (2012): no
Central database
Journal
Review of Scientific Instruments
ISSNs: 0034-6748
American Institute of Physics, United States
FI (2012): 1, ISI indexed (2012): yes
Central database
Journal
Projects
(2)Advanced metrology for magnetic tunnel junctions
Project: PhD
- Completed
Latest activities and conferences
Loading map data...
ID: 2197520