• Published

  Four point bending setup for characterization of semiconductor piezoresistance

  Publication: Research - peer-review › Journal article – Annual report year: 2008

• Published

  Determination of packaging induced 3D stress utilizing a piezocoefficient mapping device

  Publication: Research - peer-review › Article in proceedings – Annual report year: 2007

• Published

  Piezoresistance in Strained Silicon and Strained Silicon Germanium : Group IV Semiconductor Nanostructures

  Publication: Research - peer-review › Article in proceedings – Annual report year: 2007

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• IEEE, 0-7803

  Central database

  Publisher

• Factum

  Local database

  Publisher

• Review of Scientific Instruments

  ISSNs: 0034-6748

  American Institute of Physics, United States

  FI (2012): 1, ISI indexed (2012): yes

  Central database

  Journal