Lionel Cervera Gontard

Lionel Cervera Gontard

Former employee

Responsible for the Tecnai T20 TEM and for working with Titan A-TEM. His research interests include electron tomography, high-angle annular dark-field imaging, aberration-corrected electron microscopy and in situ electron microscopy of novel nanoparticles, nanostructures and devices, as well as image simulation and image processing for electron microscopy.

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  • Journal of Physics: Condensed Matter

    ISSNs: 0953-8984, 09538984

    ISSNs (Electronic): 1361-648X

    Institute of Physics Publishing, United Kingdom

    ISI indexed (2013): yes, FI (2013): 1

    Central database

    Journal

  • Ultramicroscopy

    ISSNs: 0304-3991, 03043991

    Elsevier BV, Netherlands

    ISI indexed (2013): yes, FI (2013): 1

    Central database

    Journal

  • Angewandte Chemie (International Edition)

    ISSNs: 1433-7851, 0570-0833, 14337851

    ISSNs (Electronic): 1521-3773

    Wiley - V C H Verlag GmbH & Co. KGaA, Germany

    ISI indexed (2013): yes, FI (2013): 2

    Central database

    Journal

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