Kresten Yvind

  1. 2006
  2. Published

    An in-situ monitoring technique for optimizing antireflection coatings using a monolithic integrated photodetector. / Saini, Vikram; Yvind, Kresten; Larsson, David.

    In: Semiconductor Science and Technology, Vol. 21, No. 8, 2006, p. 1030-1033.

    Publication: Research - peer-reviewJournal article – Annual report year: 2006

Download list:
Download as PDF
Select render style:
APAAuthorCBEHarvardMLAStandardVancouverShortLong
PDF
Download as HTML
Select render style:
APAAuthorCBEHarvardMLAStandardVancouverShortLong
HTML
Download as Word
Select render style:
APAAuthorCBEHarvardMLAStandardVancouverShortLong
Word