Jon Wulff Petersen
Former employee
Publications
(16)- Published
A SUBSTRATE AND A METHOD FOR DETERMINING AND/OR MONITORING ELECTROPHYSIOLOGICAL PROPERTIES OF ION CHANNELS
Publication: Research › Patent – Annual report year: 2001
- Published
Tin-vacancy acceptor levels in electron-irradiated n-type silicon
Publication: Research - peer-review › Journal article – Annual report year: 2000
- Published
Room-temperature vacancy migration in crystalline Si from an ion-implanted surface layer
Publication: Research - peer-review › Journal article – Annual report year: 1999
Thin Solid Films
ISSNs: 0040-6090, 00406090
Elsevier S.A., Switzerland
FI (2012): 1, ISI indexed (2012): yes
Central database
Journal
Applied Physics Letters
ISSNs: 0003-6951
American Institute of Physics, United States
FI (2012): 2, ISI indexed (2012): yes
Central database
Journal
Physical Review Letters
ISSNs: 0031-9007
American Physical Society, United States
FI (2012): 2, ISI indexed (2012): yes
Central database
Journal
Projects
(9)- Completed
- Completed
- Completed
Integreret opto-elektronisk hastighedssensor
Project: PhD
ID: 2196613