• Published

  Production Quality Control Of Microfluidic Chip Designs

  Publication: Research - peer-review › Article in proceedings – Annual report year: 2012

• Published

  Color effects from scattering on random surface structures in dielectrics.

  Publication: Research - peer-review › Journal article – Annual report year: 2012

• Published

  Vertical sidewall roughness measured by AFM and SEM

  Publication: Research - peer-review › Conference article – Annual report year: 2011

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• IEEE, 0-7803

  Central database

  Publisher

• Optics Express

  ISSNs: 1094-4087

  Optical Society of America, United States

  FI (2012): 2, ISI indexed (2012): yes

  Central database

  Journal

• Journal of Vacuum Science and Technology. Part B. Microelectronics and Nanometer Structures

  ISSNs: 1071-1023

  American Institute of Physics, United States

  FI (2012): 1, ISI indexed (2012): yes

  Central database

  Journal

• Measurement Science and Technology

  ISSNs: 0957-0233

  Institute of Physics Publishing, United Kingdom

  FI (2012): 2, ISI indexed (2012): yes

  Central database

  Journal