Publications
(7)- Published
Production Quality Control Of Microfluidic Chip Designs
Publication: Research - peer-review › Article in proceedings – Annual report year: 2012
- Published
Color effects from scattering on random surface structures in dielectrics.
Publication: Research - peer-review › Journal article – Annual report year: 2012
- Published
Vertical sidewall roughness measured by AFM and SEM
Publication: Research - peer-review › Conference article – Annual report year: 2011
Optics Express
ISSNs: 1094-4087
Optical Society of America, United States
FI (2012): 2, ISI indexed (2012): yes
Central database
Journal
Journal of Vacuum Science and Technology. Part B. Microelectronics and Nanometer Structures
ISSNs: 1071-1023
American Institute of Physics, United States
FI (2012): 1, ISI indexed (2012): yes
Central database
Journal
Measurement Science and Technology
ISSNs: 0957-0233
Institute of Physics Publishing, United Kingdom
FI (2012): 2, ISI indexed (2012): yes
Central database
Journal
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ID: 1290582