Hossein Alimadadi

  1. 2014
  2. Published
  3. Published
  4. Published

    Effect of grain boundary character and network of special boundaries on the thermal stability of electrodeposited nickel layers. / Alimadadi, Hossein; da Silva Fanta, Alice Bastos; Kasama, Takeshi; Somers, Marcel A. J.; Pantleon, Karen.

    2014. Abstract from EBSD 2014, London, United Kingdom.

    Publication: Research - peer-reviewConference abstract for conference – Annual report year: 2014

  5. Published

    Evolution of the preferred crystallographic orientation across the thickness of nickel electrodeposits. / Alimadadi, Hossein; da Silva Fanta, Alice Bastos; Somers, Marcel A. J.; Pantleon, Karen.

    2014. Abstract from 17th International Conference on Textures of Materials, Dresden, Germany.

    Publication: Research - peer-reviewConference abstract for conference – Annual report year: 2014

  6. Published

    Grain boundary engineering to enhance thermal stability of electrodeposited nickel. / Alimadadi, Hossein.

    2014. Abstract from 17th International Conference on Textures of Materials, Dresden, Germany.

    Publication: Research - peer-reviewConference abstract for conference – Annual report year: 2014

  7. 2013
  8. Published

    Application of Complementary Techniques for Advanced Characterization of White Etching Cracks. / West, Ole; Diederichs, Annika M.; Alimadadi, Hossein; Dahl, Kristian Vinter; Somers, Marcel A. J.

    In: Praktische Metallographie, Vol. 50, No. 6, 2013, p. 410-431.

    Publication: Research - peer-reviewJournal article – Annual report year: 2013

  9. Published
  10. Published

    Grain Boundary Engineering of Electrodeposited Thin Films. / Alimadadi, Hossein; Somers, Marcel A. J. (Supervisor); Pantleon, Karen (Main supervisor).

    Kgs. Lyngby : Technical University of Denmark, 2013. 275 p.

    Publication: ResearchPh.D. thesis – Annual report year: 2013

  11. Published
  12. 2012
  13. Published

    Dislocation density and Burgers vector population in fiber-textured Ni thin films determined by high-resolution X-ray line profile analysis. / Csiszár, Gábor; Pantleon, Karen; Alimadadi, Hossein; Ribárik, Gábor; Ungár, Tamás.

    In: Journal of Applied Crystallography, Vol. 45, No. 1, 2012, p. 61-70.

    Publication: Research - peer-reviewJournal article – Annual report year: 2012

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