Henrik Hartmann Henrichsen

  1. Journal of Vacuum Science and Technology. Part B. Microelectronics and Nanometer Structures

    ISSNs: 1071-1023, 2166-2746

    Additional searchable ISSN (Electronic): 1520-8567

    American Institute of Physics, United States

    BFI (2018): BFI-level 1, Scopus rating (2017): SJR 0.467 SNIP 0.631, ISI indexed (2013): ISI indexed yes, Web of Science (2018): Indexed yes

    Central database

    Journal

  2. Measurement Science and Technology

    ISSNs: 0957-0233

    Additional searchable ISSN (Electronic): 1361-6501

    Institute of Physics Publishing Ltd., United Kingdom

    BFI (2018): BFI-level 2, Scopus rating (2017): SJR 0.53 SNIP 1.061, ISI indexed (2013): ISI indexed yes, Web of Science (2018): Indexed yes

    Central database

    Journal

  3. Microelectronic Engineering

    ISSNs: 0167-9317

    Additional searchable ISSN (Electronic): 1873-5568

    Elsevier BV, Netherlands

    BFI (2018): BFI-level 2, Scopus rating (2017): SJR 0.604 SNIP 0.937, ISI indexed (2013): ISI indexed yes, Web of Science (2018): Indexed yes

    Central database

    Journal

  4. Nanotechnology

    ISSNs: 0957-4484

    Additional searchable ISSN (Electronic): 1361-6528

    Institute of Physics Publishing Ltd., United Kingdom

    BFI (2018): BFI-level 1, Scopus rating (2017): SJR 1.079 SNIP 0.788, ISI indexed (2013): ISI indexed yes, Web of Science (2018): Indexed yes

    Central database

    Journal

  5. Organic Electronics

    ISSNs: 1566-1199

    Elsevier BV * North-Holland, Netherlands

    BFI (2018): BFI-level 2, Scopus rating (2017): SJR 1.085 SNIP 0.884, ISI indexed (2013): ISI indexed yes, Web of Science (2018): Indexed yes

    Central database

    Journal

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