Henrik Hartmann Henrichsen

  1. Journal of Vacuum Science and Technology. Part B. Microelectronics and Nanometer Structures

    ISSNs: 1071-1023, 2166-2746

    Additional searchable ISSN (Electronic): 1520-8567

    American Institute of Physics, United States

    BFI (2017): BFI-level 1, Scopus rating (2016): CiteScore 1.08 SJR 0.444 SNIP 0.499, ISI indexed (2013): ISI indexed yes, Web of Science (2017): Indexed Yes

    Central database

    Journal

  2. Measurement Science and Technology

    ISSNs: 0957-0233

    Additional searchable ISSN (Electronic): 1361-6501

    IOP Publishing Ltd, United Kingdom

    BFI (2017): BFI-level 2, Scopus rating (2016): CiteScore 1.75 SJR 0.668 SNIP 1.173, ISI indexed (2013): ISI indexed yes, Web of Science (2017): Indexed yes

    Central database

    Journal

  3. Microelectronic Engineering

    ISSNs: 0167-9317

    Additional searchable ISSN (Electronic): 1873-5568

    Elsevier BV, Netherlands

    BFI (2017): BFI-level 2, Scopus rating (2016): CiteScore 1.69 SJR 0.606 SNIP 0.999, ISI indexed (2013): ISI indexed yes, Web of Science (2017): Indexed yes

    Central database

    Journal

  4. Nanotechnology

    ISSNs: 0957-4484

    Additional searchable ISSN (Electronic): 1361-6528

    IOP Publishing Ltd, United Kingdom

    BFI (2017): BFI-level 2, Scopus rating (2016): CiteScore 2.87 SJR 1.096 SNIP 0.814, ISI indexed (2013): ISI indexed yes, Web of Science (2017): Indexed yes

    Central database

    Journal

  5. Organic Electronics

    ISSNs: 1566-1199

    Elsevier BV * North-Holland, Netherlands

    BFI (2017): BFI-level 2, Scopus rating (2016): CiteScore 3.4 SJR 1.068 SNIP 0.987, ISI indexed (2013): ISI indexed yes, Web of Science (2017): Indexed Yes

    Central database

    Journal

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