Henning Friis Poulsen

  1. 2010
  2. Published

    Phase retrieval for superposed signals from multiple binary objects. / Alpers, Andreas; Herman, Gabor T.; Poulsen, Henning Friis; Schmidt, Søren.

    In: Optical Society of America. Journal A: Optics, Image Science, and Vision, Vol. 27, No. 9, 2010, p. 1927-1937.

    Publication: Research - peer-reviewJournal article – Annual report year: 2010

  3. Published

    DART: a robust algorithm for fast reconstruction of three-dimensional grain maps. / Batenburg, K.J.; Sijbers, J.; Poulsen, Henning Friis; Bergbäck Knudsen, Erik.

    In: Journal of Applied Crystallography, Vol. 43, No. Part 6, 2010, p. 1464-1473.

    Publication: Research - peer-reviewJournal article – Annual report year: 2010

  4. Published

    Determining grain resolved stresses in polycrystalline materials using three-dimensional X-ray diffraction. / Oddershede, Jette; Schmidt, Søren; Poulsen, Henning Friis; Sørensen, Henning Osholm; Wright, Jonathan; Reimers, Walter.

    In: Journal of Applied Crystallography, Vol. 43, No. 3, 2010, p. 539-549.

    Publication: Research - peer-reviewJournal article – Annual report year: 2010

  5. Published
  6. Published

    3Dgrain reconstruction from Boxscan data. / Lyckegaard, Allan; Alpers, Andreas; Ludwig, W.; Fonda, R.W.; Margulies, L.; Götz, A.; Sørensen, H.O.; Dey, S.R.; Poulsen, Henning Friis; Lauridsen, Erik Mejdal.

    In: Risoe International Symposium on Materials Science. Proceedings, Vol. 31, 2010, p. 329-336.

    Publication: Research - peer-reviewConference article – Annual report year: 2010

  7. Published
  8. Published

    Measuring type II stresses using 3DXRD. / Oddershede, Jette; Schmidt, Søren; Poulsen, Henning Friis; Reimers, Walter.

    In: Materials Science Forum, Vol. 652, 2010, p. 63-69.

    Publication: Research - peer-reviewConference article – Annual report year: 2010

  9. Published
  10. Published

    4D characterization of metals by 3DXRD. / Poulsen, Henning Friis (Invited author); Ludwig, W. (Invited author); Lauridsen, Erik Mejdal (Invited author); Schmidt, Søren (Invited author); Pantleon, Wolfgang (Invited author); Olsen, Ulrik Lund (Invited author); Oddershede, Jette (Invited author); Reischig, P. (Invited author); Lyckegaard, Allan (Invited author); Wright, J. (Invited author); Vaughan, G. (Invited author).

    In: Risoe International Symposium on Materials Science. Proceedings, Vol. 31, 2010, p. 101-119.

    Publication: Research - peer-reviewConference article – Annual report year: 2010

  11. Published

    The extension of ID11 for nanoscale and hierarchical characterization. / Vaughan, G.B.M.; Wright, J.P.; Bytchkov, A.; Curfs, C.; Gundlach, C.; Orlova, M.; Erra, L.; Gleyzolle, H.; Buslaps, T.; Götz, A.; Suchet, G.; Petitdemange, S.; Rossat, M.; Margulies, L.; Ludwig, W.; Snigirev, A.; Snigireva, I.; Schmidt, Søren; Sørensen, Henning Osholm; Lauridsen, Erik Mejdal; Olsen, Ulrik Lund; Oddershede, Jette; Poulsen, Henning Friis.

    In: Risoe International Symposium on Materials Science. Proceedings, Vol. 31, 2010, p. 457-476.

    Publication: Research - peer-reviewConference article – Annual report year: 2010

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