Fei Wang

  1. A I P Conference Proceedings Series

    ISSNs: 0094-243X, 0094-243x

    Additional searchable ISSN (Electronic): 1551-7616

    Springer New York LLC, United States

    BFI (2017): BFI-level 1, Scopus rating (2016): CiteScore 0.21 SJR 0.163 SNIP 0.236, ISI indexed (2013): ISI indexed no, Web of Science (2011): Indexed yes

    Central database

    Journal

  2. I E E E Electron Device Letters

    ISSNs: 0741-3106

    Additional searchable ISSN (Electronic): 1558-0563

    Institute of Electrical and Electronics Engineers, United States

    BFI (2017): BFI-level 1, Scopus rating (2016): CiteScore 3.22 SJR 1.471 SNIP 1.75, ISI indexed (2013): ISI indexed yes, Web of Science (2017): Indexed Yes

    Central database

    Journal

  3. I E E E Journal of Microelectromechanical Systems

    ISSNs: 1057-7157

    Additional searchable ISSN (Electronic): 1941-0158

    Institute of Electrical and Electronics Engineers, United States

    BFI (2017): BFI-level 2, Scopus rating (2016): CiteScore 2.09 SJR 0.712 SNIP 1.223, ISI indexed (2013): ISI indexed yes, Web of Science (2017): Indexed Yes

    Central database

    Journal

  4. Journal of Applied Physics

    ISSNs: 0021-8979

    Additional searchable ISSN (Electronic): 1089-7550

    American Institute of Physics, United States

    BFI (2017): BFI-level 1, Scopus rating (2016): CiteScore 1.72 SJR 0.632 SNIP 0.815, ISI indexed (2013): ISI indexed yes, Web of Science (2017): Indexed Yes

    Central database

    Journal

  5. Journal of Micromechanics and Microengineering

    ISSNs: 0960-1317

    Additional searchable ISSN (Electronic): 1361-6439

    Institute of Physics Publishing Ltd., United Kingdom

    BFI (2017): BFI-level 1, Scopus rating (2016): CiteScore 1.74 SJR 0.595 SNIP 1.017, ISI indexed (2013): ISI indexed yes, Web of Science (2017): Indexed Yes

    Central database

    Journal

  6. Journal of Vacuum Science and Technology. Part B. Microelectronics and Nanometer Structures

    ISSNs: 1071-1023, 2166-2746

    Additional searchable ISSN (Electronic): 1520-8567

    American Institute of Physics, United States

    BFI (2017): BFI-level 1, Scopus rating (2016): CiteScore 1.08 SJR 0.444 SNIP 0.499, ISI indexed (2013): ISI indexed yes, Web of Science (2017): Indexed Yes

    Central database

    Journal

  7. Microelectronic Engineering

    ISSNs: 0167-9317

    Additional searchable ISSN (Electronic): 1873-5568

    Elsevier BV, Netherlands

    BFI (2017): BFI-level 2, Scopus rating (2016): CiteScore 1.69 SJR 0.606 SNIP 0.999, ISI indexed (2013): ISI indexed yes, Web of Science (2017): Indexed Yes

    Central database

    Journal

  8. Optics Express

    ISSNs: 1094-4087

    Optical Society of America, United States

    BFI (2017): BFI-level 2, Scopus rating (2016): CiteScore 3.48 SJR 1.487 SNIP 1.589, ISI indexed (2013): ISI indexed yes, Web of Science (2017): Indexed Yes

    Central database

    Journal

  9. Procedia Engineering

    ISSNs: 1877-7058, 1877-7058

    Elsevier BV, Netherlands

    Scopus rating (2016): CiteScore 0.74, ISI indexed (2013): ISI indexed no, Web of Science (2010): Indexed yes

    Central database

    Journal

  10. Proceedings of SPIE, the International Society for Optical Engineering

    ISSNs: 0277-786X, 1605-7422, 0361-0748

    Additional searchable ISSN (Electronic): 1042-4687

    S P I E - International Society for Optical Engineering, United States

    BFI (2017): BFI-level 1, Scopus rating (2016): CiteScore 0.42 SNIP 0.245, ISI indexed (2013): ISI indexed no, Web of Science (2016): Indexed yes

    Central database

    Journal

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