Fei Wang
- 2009
Accurate micro Hall Effect measurements on scribe line pads, Proceedings of the 17th IEEE ØInternational Conference on Advanced Thermal Processing of Semiconductors, RTP 2009
Fei Wang (Speaker), , 29 Sep 2009 → 2 Oct 2009Activity: Lecture and oral contribution
Four-Point Probe Measurements on Inhomogeneouse Samples: A probe spacing Dependence Study, Proceedings of the 17the IEEE International Conference on Advanced Thermal Processing of Semiconductors, RTP 2009
Fei Wang (Speaker), , 29 Sep 2009 → 2 Oct 2009Activity: Lecture and oral contribution