• Published

  Optical fiber sensors fabricated by the focused ion beam technique

  Publication: Research - peer-review › Conference article – Annual report year: 2012

• Published

  Micro Hall effect metrology

  Publication: Research - peer-review › Conference abstract for conference – Annual report year: 2012

• Published

  Sensitivity of charge transport measurements to local inhomogeneities

  Publication: Research - peer-review › Conference abstract for conference – Annual report year: 2012

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• Review of Scientific Instruments

  ISSNs: 0034-6748

  American Institute of Physics, United States

  FI (2012): 1, ISI indexed (2012): yes

  Central database

  Journal

• Optics Express

  ISSNs: 1094-4087

  Optical Society of America, United States

  FI (2012): 2, ISI indexed (2012): yes

  Central database

  Journal

• Journal of Vacuum Science and Technology. Part B. Microelectronics and Nanometer Structures

  ISSNs: 1071-1023

  American Institute of Physics, United States

  FI (2012): 1, ISI indexed (2012): yes

  Central database

  Journal

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• Accurate micro Hall Effect measurements on scribe line pads, Proceedings of the 17th IEEE ØInternational Conference on Advanced Thermal Processing of Semiconductors, RTP 2009

  Activity: Lecture and oral contribution

• Four-Point Probe Measurements on Inhomogeneouse Samples: A probe spacing Dependence Study, Proceedings of the 17the IEEE International Conference on Advanced Thermal Processing of Semiconductors, RTP 2009

  Activity: Lecture and oral contribution

• IEEE, 0-7803

  Central database

  Publisher