Erik Mejdal Lauridsen

  1. 2001
  2. Published

    Plastic deformation and recrystallization studied by the 3D X-ray microscope. / Juul Jensen, D.; Kvick, Å.; Lauridsen, E.M.; Lienert, U.; Margulies, L.; Fæster Nielsen, Søren; Poulsen, H.F.

    Applications of synchrotron radiation techniques to materials science 5. ed. / S.R. Stock; D.L. Perry; S.M. Mini. Warrendale, PA : Materials Research Society, 2001. p. 227-240 (Materials Research Society Symposium Proceedings, v. 590).

    Publication: Research - peer-reviewArticle in proceedings – Annual report year: 2001

  3. Published

    Quantification of minor texture components by hard X-rays. / Poulsen, H.F.; Juul Jensen, D.; Tschentscher, T.; Wcislak, L.; Lauridsen, E.M.; Margulies, L.; Schmidt, Søren.

    In: Textures and Microstructures, Vol. 35, 2001, p. 39-54.

    Publication: Research - peer-reviewJournal article – Annual report year: 2001

  4. Published

    The 3D X-ray diffraction microscope and its application to the study of recrystallization kinetics. / Lauridsen, Erik Mejdal.

    2001. 92 p. (Denmark. Forskningscenter Risoe. Risoe-R; No. 1266(EN)).

    Publication: ResearchPh.D. thesis – Annual report year: 2001

  5. Published
  6. Published

    Tracking: A method for structural characterization of grains in powders or polycrystals. / Lauridsen, E.M.; Schmidt, Søren; Suter, R.M.; Poulsen, H.F.

    In: Journal of Applied Crystallography, Vol. 34, 2001, p. 744-750.

    Publication: Research - peer-reviewJournal article – Annual report year: 2001

  7. 2000
  8. Published

    Application of high-energy synchrotron radiation for texture studies. / Mishin, Oleg; Lauridsen, E.M.; Krieger Lassen, N.C.; Brückner, G.; Tschentscher, T.; Bay, B.; Juul Jensen, D.; Poulsen, H.F.

    In: Journal of Applied Crystallography, Vol. 33, 2000, p. 364-371.

    Publication: Research - peer-reviewJournal article – Annual report year: 2000

  9. Published

    A three-dimensional X-ray diffraction microscope for deformation studies of polycrystals. / Nielsen, F.; Lauridsen, E.M.; Juul Jensen, D.; Poulsen, H.F.

    Abstract booklet. [s.l.] : [s.n.], 2000.

    Publication: ResearchConference abstract in proceedings – Annual report year: 2000

  10. Published

    Kinetics of individual grains during recrystallization. / Lauridsen, E.M.; Juul Jensen, D.; Poulsen, H.F.; Lienert, U.

    In: Scripta Materialia, Vol. 43, 2000, p. 561-566.

    Publication: Research - peer-reviewJournal article – Annual report year: 2000

  11. Published

    Recrystallization - Fundamental aspects and relations to deformation microstructure. Proceedings. / Hansen, N.; Huang, Xiaoxu; Juul Jensen, Dorte; Lauridsen, Erik Mejdal; Leffers, Torben; Pantleon, Wolfgang; Sabin, T.J.; Wert, J.A.

    Roskilde : Risø National Laboratory, 2000. 677 p.

    Publication: Research - peer-reviewBook – Annual report year: 2000

  12. Published

    Structure determination of the Si(001)-(2 x 1)-H reconstruction by surface X-ray diffraction: Weakening of the dimer bond by the addition of hydrogen. / Lauridsen, E.M.; Baker, J.; Nielsen, M.; Feidenhans'l, R.; Falkenberg, G.; Bunk, O.; Zeysing, J.H.; Johnson, R.L.

    In: Surface Science, Vol. 453, No. 1-3, 2000, p. 18-24.

    Publication: Research - peer-reviewJournal article – Annual report year: 2000

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