Dirch Hjorth Petersen
- 2012
- Published
Activation and thermal stability of ultra-shallow B+-implants in Ge. / Yates, B. R.; Darby, B. L.; Petersen, Dirch Hjorth; Hansen, Ole; Lin, Rong; Nielsen, P. F.; Romano, L.; Doyle, B. L.; Kontos, A.; Jones, K. S.
In: Journal of Applied Physics, Vol. 112, No. 12, 2012.Publication: Research - peer-review › Journal article – Annual report year: 2012
- Published
Advanced characterization of carrier profiles in germanium using micro-machined contact probes. / Clarysse, T.; Konttinen, M.; Parmentier, B.; Moussa, A.; Vandervorst, W.; Impellizzeri, G.; Napolitani, E.; Privitera, V.; Nielsen, Peter Folmer; Petersen, Dirch Hjorth; Hansen, Ole.
In: A I P Conference Proceedings Series, Vol. 1496, 2012, p. 167-170.Publication: Research - peer-review › Conference article – Annual report year: 2012
- Published
Graphene Conductance Uniformity Mapping. / Buron, Jonas Christian Due; Petersen, Dirch Hjorth; Bøggild, Peter; Cooke, David G.; Hilke, Michael; Sun, Jie; Whiteway, Eric; Nielsen, Peter F.; Hansen, Ole; Yurgens, August; Jepsen, Peter Uhd.
In: Nano Letters, 2012.Publication: Research - peer-review › Journal article – Annual report year: 2012
- Published
In-situ Ga doping of fully strained Ge1-xSnx heteroepitaxial layers grown on Ge(001) substrates. / Shimura, Y.; Takeuchi, S.; Nakatsuka, O.; Vincent, B.; Gencarelli, F.; Clarysse, T.; Vandervorst, W.; Caymax, M.; Loo, R.; Jensen, A.; Petersen, Dirch Hjorth; Zaima, S.
In: Thin Solid Films, Vol. 520, No. 8, 2012, p. 3206-3210.Publication: Research - peer-review › Journal article – Annual report year: 2012
- Published
Junction leakage measurements with micro four-point probes. / Lin, Rong ; Petersen, Dirch Hjorth; Wang, Fei; Yates, Bradley R.; Jones, Kevin S.; Hansen, Ole; Kontos, Alex; Nielsen, Peter Folmer.
In: A I P Conference Proceedings Series, Vol. 1496, 2012, p. 175-178.Publication: Research - peer-review › Conference article – Annual report year: 2012
- Published
Large area characterisation of CVD graphene electrical properties. / Buron, Jonas Christian Due; Jepsen, Peter Uhd; Petersen, Dirch Hjorth; Bøggild, Peter; Hansen, Ole; Cooke, David; Hilke, Michael; Whiteway, Eric; Sun, Jie; Yurgens, Avgust; Nielsen, Peter F.
In: Carbonhagen 2012: 3rd Symposium on graphene and carbon nanotubes. 2012. p. 20.Publication: Research - peer-review › Conference abstract in proceedings – Annual report year: 2012
- Published
Micro Four-Point Probe and Micro Hall Effect : Methods for Reliable Electrical Characterization of Ultra-Shallow Junctions. / Petersen, Dirch Hjorth; Bøggild, Peter (Supervisor); Hansen, Ole (Supervisor); Nielsen, Peter F. (Supervisor); Vandervorst , Wilfried (Supervisor).
2012. 64 p.Publication: Research › Ph.d. thesis – Annual report year: 2012
- Published
Micro four-point probe characterization of graphene. / Klarskov, Mikkel Buster; Booth, Tim ; Petersen, Dirch Hjorth; Bøggild, Peter.
2012. Poster session presented at 3rd Symposium on Graphene and Carbon Nanotubes, Copenhagen, Denmark.Publication: Research - peer-review › Poster – Annual report year: 2012
- Published
Micro Hall effect metrology. / Petersen, Dirch Hjorth; Hansen, Ole; Wang, Fei; Østerberg, Frederik Westergaard; Henrichsen, Henrik Hartmann; Bøggild, Peter; Lin, Rong; Nielsen, Peter Folmer; Clarysse, T.; Rosseel, E. ; Vandervorst, W. .
2012. Abstract from International Conference on Ion Implantation Technology, Valladolid, Spain.Publication: Research - peer-review › Conference abstract for conference – Annual report year: 2012
- Published
Microprobe metrology for direct sheet resistance and mobility characterization. / Nielsen, Peter Folmer; Petersen, Dirch Hjorth; Lin, Rong; Jensen, Ane; Henrichsen, Henrik Hartmann; Gammelgaard, Lauge; Kjær, Daniel; Hansen, Ole.
In: Proceedings of the 12th International Workshop on Junction Technology. 2012.Publication: Research - peer-review › Article in proceedings – Annual report year: 2012