Dirch Hjorth Petersen

  1. 2015
  2. Published

    Advanced Metrology for Characterization of Magnetic Tunnel Junctions. / Kjær, Daniel; Petersen, Dirch Hjorth (Supervisor); Hansen, Ole (Supervisor); Nielsen, Peter F. (Supervisor).

    DTU Nanotech, 2015. 149 p.

    Publication: ResearchPh.D. thesis – Annual report year: 2015

  3. Published

    Characterization of magnetic tunnel junction test pads. / Østerberg, Frederik Westergaard; Kjær, Daniel; Nielsen, Peter Folmer; Hansen, Ole; Petersen, Dirch Hjorth.

    In: Journal of Applied Physics, Vol. 118, No. 14, 2015, p. 143901.

    Publication: Research - peer-reviewJournal article – Annual report year: 2015

  4. Published

    Fabrication of CVD graphene-based devices via laser ablation for wafer-scale characterization. / Mackenzie, David; Buron, Jonas Christian Due; Whelan, Patrick Rebsdorf; Jessen, Bjarke Sørensen; Silajdźić, Adnan; Pesquera, Amaia; Centeno, Alba; Zurutuza, Amaia; Bøggild, Peter; Petersen, Dirch Hjorth.

    In: 2D materials, Vol. 2, No. 4, 045003, 2015.

    Publication: Research - peer-reviewJournal article – Annual report year: 2015

  5. Published

    Fast static field CIPT mapping of unpatterned MRAM film stacks. / Kjær, Daniel; Hansen, Ole; Henrichsen, Henrik Hartmann; Chenchen, Jacob Wang; Nørgaard, Kristian Petersen; Nielsen, Peter Folmer; Petersen, Dirch Hjorth.

    In: Measurement Science and Technology, Vol. 26, No. 4, 2015, p. 045602.

    Publication: Research - peer-reviewJournal article – Annual report year: 2015

  6. Published
  7. Accepted/In press

    Multi-electrode probe geometry optimization for characterization of magnetic tunnel junction stacks. / Cagliani, Alberto; Kjær, Daniel; Østerberg, Frederik Westergaard; Hansen, Ole; Nielsen, Peter Folmer; Petersen, Dirch Hjorth.

    2015. Abstract from 13th Joint MMM-Intermag Conference, San Diego, CA, United States.

    Publication: Research - peer-reviewConference abstract for conference – Annual report year: 2015

  8. Published
  9. Published
  10. 2014
  11. Published

    Automated Micro Hall Effect measurements. / Petersen, Dirch Hjorth; Henrichsen, Henrik Hartmann; Lin, Rong; Nielsen, Peter F.; Hansen, Ole.

    Proceedings of the 2014 7th International Silicon-Germanium Technology and Device Meeting. 2014. p. 37-38.

    Publication: Research - peer-reviewConference abstract in proceedings – Annual report year: 2014

  12. Published
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