Dirch Hjorth Petersen

  1. 2017
  2. Published

    Batch fabrication of nanopatterned graphene devices via nanoimprint lithography. / Mackenzie, David; Smistrup, Kristian ; Whelan, Patrick Rebsdorf; Luo, Birong; Shivayogimath, Abhay; Nielsen, Theodor; Petersen, Dirch Hjorth; Messina, Sara A.; Bøggild, Peter.

    In: Applied Physics Letters, Vol. 111, 193103, 2017.

    Publication: Research - peer-reviewJournal article – Annual report year: 2017

  3. Published

    Breakthrough In Current In Plane Metrology For Monitoring Large Scale MRAM Production. / Cagliani, Alberto; Østerberg, Frederik Westergaard; Hansen, Ole; Petersen, Dirch Hjorth; Shiv, Lior; Nielsen, Peter F.

    2017 IEEE International Memory Workshop (IMW). IEEE, 2017. p. 169-171.

    Publication: Research - peer-reviewArticle in proceedings – Annual report year: 2017

  4. Published

    Breakthrough in current-in-plane tunneling measurement precision by application of multi-variable fitting algorithm. / Cagliani, Alberto; Østerberg, Frederik Westergaard; Hansen, Ole; Shiv, Lior; Nielsen, Peter Folmer; Petersen, Dirch Hjorth.

    In: Review of Scientific Instruments, Vol. 88, No. 9, 095005, 2017.

    Publication: Research - peer-reviewJournal article – Annual report year: 2017

  5. Published
  6. Published
  7. Published

    Mapping the electrical properties of large-area graphene. / Bøggild, Peter; Mackenzie, David; Whelan, Patrick Rebsdorf; Petersen, Dirch Hjorth; Buron, Jonas Christian Due; Zurutuza, Amaia; Gallop, John; Hao, Ling; Jepsen, Peter Uhd.

    In: 2D materials, Vol. 4, No. 4, 042003, 2017.

    Publication: Research - peer-reviewReview – Annual report year: 2017

  8. Published
  9. Published

    Precision of Micro Hall Effect Measurements in Scribe Line Test Pads. / Witthøft, Maria-Louise; Østerberg, Frederik Westergaard; Bogdanowicz, Janusz; Schulze, Andreas; Vanderhorst, Wilfried; Heinrichsen, Henrik H.; Nielsen, Peter D.; Hansen, Ole; Petersen, Dirch Hjorth.

    2017. Abstract from International Conference on Frontiers of Characterization and Metrology for Nanoelectronics 2017, Monterey, CA, United States.

    Publication: Research - peer-reviewConference abstract for conference – Annual report year: 2017

  10. Published
  11. Published

    Reversible hysteresis inversion in MoS2 field effect transistors. / Kaushik, Naveen; Mackenzie, David M. A.; Thakar, Kartikey; Goyal, Natasha; Mukherjee, Bablu; Bøggild, Peter; Petersen, Dirch Hjorth; Lodha, Saurabh.

    In: Npj 2d Materials and Applications, Vol. 1, No. 1, 334, 2017.

    Publication: Research - peer-reviewJournal article – Annual report year: 2017

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