David Larsson
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- 2006
- Published
An in-situ monitoring technique for optimizing antireflection coatings using a monolithic integrated photodetector. / Saini, Vikram; Yvind, Kresten; Larsson, David.
In: Semiconductor Science and Technology, Vol. 21, No. 8, 2006, p. 1030-1033.Publication: Research - peer-review › Journal article – Annual report year: 2006