Daniel Kjær

  1. 2014
  2. Published

    Electrical characterization of sputtered ZnO:Al films with microprobe technique. / Crovetto, Andrea; Kjær, Daniel; Petersen, Dirch Hjorth; Schou, Jørgen; Hansen, Ole.

    Proceedings of the 5th International Symposium on Transparant Conductive Materials . 2014.

    Publication: Research - peer-reviewConference abstract in proceedings – Annual report year: 2014

  3. Published

    Electrical property mapping of ZnO:Al films with micro four-point-probe technique. / Crovetto, Andrea; Kjær, Daniel; Petersen, Dirch Hjorth; Schou, Jørgen; Hansen, Ole.

    2014. Poster session presented at 5th International Symposium on Transparent Conductive Materials , Chania, Greece.

    Publication: Research - peer-reviewPoster – Annual report year: 2014

  4. Published

    Precision of single-engage micro Hall effect measurements. / Henrichsen, Henrik Hartmann; Hansen, Ole; Kjær, Daniel; Nielsen, P.F.; Wang, Fei; Petersen, Dirch Hjorth.

    Proceedings of the 14th International Workshop on Junction Technology. 2014.

    Publication: Research - peer-reviewArticle in proceedings – Annual report year: 2014

  5. Published
  6. 2012
  7. Published

    Microprobe metrology for direct sheet resistance and mobility characterization. / Nielsen, Peter Folmer; Petersen, Dirch Hjorth; Lin, Rong; Jensen, Ane; Henrichsen, Henrik Hartmann; Gammelgaard, Lauge; Kjær, Daniel; Hansen, Ole.

    Proceedings of the 12th International Workshop on Junction Technology. 2012.

    Publication: Research - peer-reviewArticle in proceedings – Annual report year: 2012

  8. 2010
  9. Published

    Review of electrical characterization of ultra-shallow junctions with micro four-point probes. / Petersen, Dirch Hjorth; Hansen, Ole; Hansen, Torben M.; Bøggild, Peter; Lin, Rong; Kjær, Daniel; Nielsen, P.F.; Clarysse, T.; Vandervorst, W.; Rosseel, E.; Bennett, N.S.; Cowern, N.E.B.

    In: Journal of Vacuum Science and Technology. Part B. Microelectronics and Nanometer Structures, Vol. 28, No. 1C, 2010, p. 27-33.

    Publication: Research - peer-reviewJournal article – Annual report year: 2010

  10. 2009
  11. Published
  12. 2008
  13. Published

    Comparative study of size dependent four-point probe sheet resistance measurement on laser annealed ultra-shallow junctions. / Petersen, Dirch Hjorth; Lin, Rong; Hansen, Torben Mikael; Rosseel, E.; Vandervorst, W.; Markvardsen, C.; Kjær, Daniel; Nielsen, Peter Folmer.

    In: Journal of Vacuum Science & Technology B, Vol. 26, No. 1, 2008, p. 362-367.

    Publication: Research - peer-reviewJournal article – Annual report year: 2008

  14. Published

    Micro Four-Point Probe with High Spatial Resolution for Ion Implantation and Ultra-Shallow Junction Characterization. / Kjær, Daniel; Lin, Rong; Petersen, Dirch Hjorth; Kopalidis, Petros M.; Eddy, Ronald; Walker, David A.; Egelhoff, William F.; Pickert, Larry.

    AIP Conference Proceedings. 1066. ed. American Institute of Physics, 2008.

    Publication: Research - peer-reviewArticle in proceedings – Annual report year: 2008

  15. 2007
  16. Published

    A comparative study of size dependent four-point probe sheet resistance measurement on laser annealed ultra shallow junctions. / Petersen, Dirch Hjorth; Lin, Rong; Hansen, Torben Mikael; Rosseel, E.; Vandervorst, W.; Markvardsen, C.; Kjær, Daniel; Nielsen, Peter Folmer.

    2007. Abstract from AVS INSIGHT-2007 Workshop, Napa, Canada.

    Publication: Research - peer-reviewConference abstract for conference – Annual report year: 2007

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