Christian Kallesøe
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- 2012
- Published
3D mechanical measurements with an atomic force microscope on 1D structures.. / Kallesøe, Christian; Larsen, Martin Benjamin Barbour Spanget; Bøggild, Peter; Mølhave, Kristian.
In: Review of Scientific Instruments, Vol. 83, No. 2, 2012, p. 023704-01 - 023704-07.Publication: Research - peer-review › Journal article – Annual report year: 2012
- Published
In Situ TEM Creation and Electrical Characterization of Nanowire Devices. / Kallesøe, Christian; Wen, Cheng-Yen; Booth, Timothy J.; Hansen, Ole; Bøggild, Peter; Ross, Frances M.; Mølhave, Kristian.
In: Nano Letters, Vol. 12, No. 6, 2012, p. 2965-2970.Publication: Research - peer-review › Journal article – Annual report year: 2012