• Published

  Injection molding tools with micro/nano-meter pattern

  Publication: Research › Patent – Annual report year: 2012

• Published

  Injection molding tools with micro/nano-peter pattern

  Publication: Research › Patent – Annual report year: 2011

• Published

  Vertical sidewall roughness measured by AFM and SEM

  Publication: Research - peer-review › Conference article – Annual report year: 2011

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• Journal of Vacuum Science and Technology. Part B. Microelectronics and Nanometer Structures

  ISSNs: 1071-1023

  American Institute of Physics, United States

  FI (2012): 1, ISI indexed (2012): yes

  Central database

  Journal

• Optics Express

  ISSNs: 1094-4087

  Optical Society of America, United States

  FI (2012): 2, ISI indexed (2012): yes

  Central database

  Journal

• Journal of Magnetism and Magnetic Materials

  ISSNs: 0304-8853

  Elsevier BV North-Holland, Netherlands

  FI (2012): 1, ISI indexed (2012): yes

  Central database

  Journal

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• Completed

  Nano-Imprint-Lithography (NIL)

  Project: PhD

• IEEE, 0-7803

  Central database

  Publisher

• Royal Society of Chemistry, 0-85404

  Central database

  Publisher