• Published

  Preparation of platinum/iridium scanning probe microscopy tips

  Publication: Research - peer-review › Journal article – Annual report year: 1999

• Published

  A technique for positioning nanoparticles using an atomic force microscope

  Publication: Research - peer-review › Journal article – Annual report year: 1998

• Published

  Contrast artifacts in tapping tip atomic force microscopy

  Publication: Research - peer-review › Journal article – Annual report year: 1998

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• Review of Scientific Instruments

  ISSNs: 0034-6748, 0034-6748

  Additional searchable ISSN (Electronic): 1089-7623

  American Institute of Physics, United States

  ISI indexed (2013): ISI indexed yes, BFI (2015): BFI-level 1, Scopus rating (2015): 0.571 0.754

  Central database

  Journal

• Applied Physics A

  ISSNs: 0947-8396, 0947-8396

  Additional searchable ISSN (Electronic): 1432-0630

  Springer, Germany

  ISI indexed (2013): ISI indexed yes, BFI (2015): BFI-level 1, Scopus rating (2015): 0.535 0.739

  Central database

  Journal

• Journal of Applied Physics

  ISSNs: 0021-8979, 0021-8979

  Additional searchable ISSN (Electronic): 1089-7550

  American Institute of Physics, United States

  ISI indexed (2013): ISI indexed yes, BFI (2015): BFI-level 1, Scopus rating (2015): 0.603 0.755

  Central database

  Journal

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• Completed

  Fundamentale virkemåder af tapping mode atomic force mikroskopi

  Project

• Completed

  Scanning probe mikroskopi (AFM/STM) af nanopartikler deponeret på flade substrater

  Project