1. 2014
  2. Published

    Automated Micro Hall Effect measurements. / Petersen, Dirch Hjorth; Henrichsen, Henrik Hartmann; Lin, Rong; Nielsen, Peter F.; Hansen, Ole.

    Proceedings of the 2014 7th International Silicon-Germanium Technology and Device Meeting. 2014. p. 37-38.

    Publication: Research - peer-reviewConference abstract in proceedings – Annual report year: 2014

  3. Published
  4. Accepted

    CVD graphene growth on non-planar surfaces, a pilot investigation. / Stoot, Adam Carsten; Christiansen, Alexander Bruun; Larsen, Martin Benjamin Barbour Spanget; Bøggild, Peter.

    Proceedings of Graphene 2014. 2014.

    Publication: Research - peer-reviewConference abstract in proceedings – Annual report year: 2014

  5. Published

    Directed self-assembled crystalline oligomer domains on graphene and graphite : Paper. / Balzer, Frank; Henrichsen, Henrik Hartmann; Klarskov, Mikkel Buster; Booth, Tim ; Sun, Rong; Parisi, Jürgen; Schiek, Manuela; Bøggild, Peter.

    In: Nanotechnology, Vol. 25, No. 3, 2014, p. 035602.

    Publication: Research - peer-reviewJournal article – Annual report year: 2014

  6. Published
  7. Published

    Electrical characterization of sputtered ZnO:Al films with microprobe technique. / Crovetto, Andrea; Kjær, Daniel; Petersen, Dirch Hjorth; Schou, Jørgen; Hansen, Ole.

    Proceedings of the 5th International Symposium on Transparant Conductive Materials . 2014.

    Publication: Research - peer-reviewConference abstract in proceedings – Annual report year: 2014

  8. Published
  9. Published

    Electrical property mapping of ZnO:Al films with micro four-point-probe technique. / Crovetto, Andrea; Kjær, Daniel; Petersen, Dirch Hjorth; Schou, Jørgen; Hansen, Ole.

    2014. Poster session presented at 5th International Symposium on Transparent Conductive Materials , Chania, Greece.

    Publication: Research - peer-reviewPoster – Annual report year: 2014

  10. Published
  11. Published

    Epitaxial growth of Quantum Dots on InP for device applications operating in the 1.55 mu m wavelength range. / Semenova, Elizaveta; Kulkova, Irina; Kadkhodazadeh, Shima; Barettin, Daniele; Kopylov, Oleksii; Cagliani, Alberto; Almdal, Kristoffer; Willatzen, Morten; Yvind, Kresten.

    Proceedings of SPIE. Vol. 8996 SPIE - International Society for Optical Engineering, 2014.

    Publication: Research - peer-reviewArticle in proceedings – Annual report year: 2014

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