1. 1981
  2. Published

    Extended X-Ray Absorption Fine Structure Study of Co-Mo Hydrodesulfurization Catalysts. / Clausen, Bjerne S.; Topsøe, H.; Candia, R.; Villadsen, J.; Lengeler, B.; Als-Nielsen, Jens Aage; Christensen, Finn Erland.

    In: Journal of Physical Chemistry, Vol. 85, No. 25, 1981, p. 3868-3872.

    Publication: Research - peer-reviewJournal article – Annual report year: 1981

  3. 1982
  4. Published

    Smectic-A Order at the Surface of a Nematic Liquid Crystal : Synchrotron X-Ray Diffraction. / Als-Nielsen, Jens Aage; Christensen, Finn Erland; Pershan, P. S.

    In: Physical Review Letters, Vol. 48, No. 16, 1982, p. 1107-1110.

    Publication: Research - peer-reviewJournal article – Annual report year: 1982

  5. 1985
  6. Published

    Doubly curved imaging Bragg crystal spectrometer for X-ray astronomy. / Byrnak, B. P.; Christensen, Finn Erland; Westergaard, Niels Jørgen Stenfeldt; Schnopper, H. W.

    In: Applied Optics, Vol. 24, No. 16, 1985, p. 2543-2547.

    Publication: Research - peer-reviewJournal article – Annual report year: 1985

  7. 1986
  8. Published

    Measurements of Surface Roughness of Mirrored Surfaces Using a Triple-axis Perfect-Crystal X-ray Diffractometer. / Christensen, Finn Erland; Hornstrup, Allan; Schnopper, Herbert W.

    RAL. Vol. 87-043 1986.

    Publication: ResearchArticle in proceedings – Annual report year: 1986

  9. 1987
  10. Published
  11. 1988
  12. Published

    High-resolution X-ray diffraction studies of multilayers. / Christensen, Finn Erland; Hornstrup, Allan; Schnopper, H. W.

    In: Journal of Applied Crystallography, Vol. 21, 1988, p. 252-257.

    Publication: Research - peer-reviewJournal article – Annual report year: 1988

  13. Published

    High resolution X-ray scattering studies of substrates and multilayers. / Christensen, Finn Erland.

    In: Revue de Physique Appliquee, Vol. 23, No. 10, 1988, p. 1701-1710.

    Publication: Research - peer-reviewJournal article – Annual report year: 1988

  14. Published

    Surface correlation function analysis of high resolution scattering data from mirrored surfaces obtained using a triple-axis X-ray diffractometer. / Christensen, Finn Erland; Hornstrup, Allan; Schnopper, H. W.

    In: Applied Optics, Vol. 27, No. 8, 1988, p. 1548-1557.

    Publication: Research - peer-reviewJournal article – Annual report year: 1988

  15. 1989
  16. Published

    A Test Facility For Astronomical X-Ray Optics. / Lewis, R. A.; Bordas, J.; Christensen, Finn Erland.

    In: Proceedings of SPIE, the International Society for Optical Engineering, Vol. 1160, 1989, p. 500-506.

    Publication: Research - peer-reviewConference article – Annual report year: 1989

  17. Published

    Extreme UV and X-ray scattering measurements from a rough LiF crystal surface characterized by electron micrography. / Alehyane; Arbaoui; Barchewitz; Andre, ; Christensen, Finn Erland; Hornstrup, Allan; Palmari; Rasigni; Rivoira; Rasigni.

    In: Applied Optics, Vol. 28, No. 10, 1989, p. 1763-1772.

    Publication: Research - peer-reviewJournal article – Annual report year: 1989

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