Thin Solid Films

ISSNs: 0040-6090, 0040-6090

Elsevier S.A., Switzerland

ISI indexed (2013): ISI indexed yes, BFI (2015): BFI-level 1, Scopus rating (2015): 0.726 0.942

Central database

Journal

  1. 1999
  2. Published

    The initial oxidation of epsilon-Fesub2Nsub1-x: growth kinetics. / Graat, Peter C.J.; Somers, Marcel A. J.; Mittemeijer, Eric J.

    In: Thin Solid Films, Vol. 353, No. 1-2, 1999, p. 72-78.

    Publication: Research - peer-reviewJournal article – Annual report year: 1999

  3. 1998
  4. Published

    Bimodal height distribution of self-assembled germanium islands grown on Si0.84Ge0.16 pseudo-substrates. / Pedersen, Erik Vesterlund; Jensen, Flemming; Shiryaev, Sergey Y.; Petersen, Jon Wulff; Lundsgaard Hansen, J.; Nylandsted Larsen, A.

    In: Thin Solid Films, Vol. 321, No. 1, 1998, p. 92-97.

    Publication: Research - peer-reviewJournal article – Annual report year: 1998

  5. Published

    Crack formation mechanisms during micro and macro indentation of diamond-like carbon coatings on elastic-plastic substrates. / Thomsen, N.B.; Fischer-Cripps, A.C.; Swain, M.V.

    In: Thin Solid Films, Vol. 332, 1998, p. 180-184.

    Publication: ResearchJournal article – Annual report year: 1998

  6. Published

    Influence of head group methylation on the phase behavior of lipid monolayers. / Brezesinski, G.; Bringezu, F.; Weidemann, G.; Howes, P.B.; Kjær, K.; Möhwald, H.

    In: Thin Solid Films, Vol. 329, 1998, p. 256-261.

    Publication: ResearchJournal article – Annual report year: 1998

  7. Properties of carbon nitride films deposited by magnetron sputtering. / Kusano, Yukihiro; Evetts, J.E.; Somekh, R.E.; Hutchings, I.M.

    In: Thin Solid Films, Vol. 332, No. 1-2, 1998, p. 56-61.

    Publication: Research - peer-reviewJournal article – Annual report year: 1998

  8. Published

    Residual stress determination in PECVD TiN coatings by X-ray diffraction: a parametric study. / Thomsen, N.B.; Horsewell, Andy; Mogensen, K.S.; Eskildsen, S.S.; Mathiasen, C.; Bøttiger, J.

    In: Thin Solid Films, Vol. 333, No. 1-2, 1998, p. 50-59.

    Publication: Research - peer-reviewJournal article – Annual report year: 1998

  9. 1997
  10. Published

    Cold-walled UHV/CVD batch reactor for the growth of Si1_x/Gex layers. / Thomsen, Erik Vilain; Christensen, Carsten; Andersen, C.R.; Pedersen, Erik Vesterlund; Egginton, Paul Nicholas; Hansen, Ole; Petersen, Jon Wulff.

    In: Thin Solid Films, Vol. 294, No. 1-2, 1997, p. 72-75.

    Publication: Research - peer-reviewJournal article – Annual report year: 1997

  11. Published

    Dislocation patterning-a new tool for spatial manipulation of Ge islands. / Shiryaev, S.Y.; Pedersen, Erik Vesterlund; Jensen, Flemming; Petersen, Jon Wulff; Hansen, J.L.; Larsen, Nylandsted Arne.

    In: Thin Solid Films, Vol. 294, 1997, p. 311-314.

    Publication: Research - peer-reviewJournal article – Annual report year: 1997

  12. 1996
  13. Published

    Chirality effects on 2D phase transitions. / Scalas, E.; Brezesinski, G.; Möhwald, H.; Kaganer, V.M.; Bouwman, W.G.; Kjær, K.

    In: Thin Solid Films, Vol. 285, 1996, p. 56-61.

    Publication: ResearchJournal article – Annual report year: 1996

  14. Published

    MBE growth and characterisation of light rare-earth superlattices. / Ward, R.C.C.; Wells, M.R.; Bryn-Jacobsen, C.; Cowley, R.A.; Goff, J.P.; McMorrow, D.F.; Simpson, J.A.

    In: Thin Solid Films, Vol. 275, No. 1-2, 1996, p. 137-139.

    Publication: ResearchJournal article – Annual report year: 1996

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