Thin Solid Films
ISSNs: 0040-6090, 00406090
Elsevier S.A., Switzerland
FI (2012): 1, ISI indexed (2012): yes
Central database
Journal
- 1999
- Published
Ellipsometric analysis of the oxidation of alpha-iron and epsilon-Fesub2Nsub1-x. / Graat, Peter C.J.; Somers, Marcel A. J.; Mittemeijer, Eric J.
In: Thin Solid Films, Vol. 340, 1999, p. 87-94.Publication: Research - peer-review › Journal article – Annual report year: 1999
- Published
The initial oxidation of epsilon-Fesub2Nsub1-x: growth kinetics. / Graat, Peter C.J.; Somers, Marcel A. J.; Mittemeijer, Eric J.
In: Thin Solid Films, Vol. 353, No. 1-2, 1999, p. 72-78.Publication: Research - peer-review › Journal article – Annual report year: 1999
- 1998
- Published
Bimodal height distribution of self-assembled germanium islands grown on Si0.84Ge0.16 pseudo-substrates. / Pedersen, Erik Vesterlund; Jensen, Flemming; Shiryaev, Sergey Y.; Petersen, Jon Wulff; Lundsgaard Hansen, J.; Nylandsted Larsen, A.
In: Thin Solid Films, Vol. 321, No. 1, 1998, p. 92-97.Publication: Research - peer-review › Journal article – Annual report year: 1998
- Published
Crack formation mechanisms during micro and macro indentation of diamond-like carbon coatings on elastic-plastic substrates. / Thomsen, N.B.; Fischer-Cripps, A.C.; Swain, M.V.
In: Thin Solid Films, Vol. 332, 1998, p. 180-184.Publication: Research › Journal article – Annual report year: 1998
- Published
Influence of head group methylation on the phase behavior of lipid monolayers. / Brezesinski, G.; Bringezu, F.; Weidemann, G.; Howes, P.B.; Kjær, K.; Möhwald, H.
In: Thin Solid Films, Vol. 329, 1998, p. 256-261.Publication: Research › Journal article – Annual report year: 1998
- External
Properties of carbon nitride films deposited by magnetron sputtering. / Kusano, Yukihiro; Evetts, J.E.; Somekh, R.E.; Hutchings, I.M.
In: Thin Solid Films, Vol. 332, No. 1-2, 1998, p. 56-61.Publication: Research - peer-review › Journal article – Annual report year: 1998
- Published
Residual stress determination in PECVD TiN coatings by X-ray diffraction: a parametric study. / Thomsen, N.B.; Horsewell, Andy; Mogensen, K.S.; Eskildsen, S.S.; Mathiasen, C.; Bøttiger, J.
In: Thin Solid Films, Vol. 333, No. 1-2, 1998, p. 50-59.Publication: Research - peer-review › Journal article – Annual report year: 1998
- 1997
- Published
Cold-walled UHV/CVD batch reactor for the growth of Si1_x/Gex layers. / Thomsen, Erik Vilain; Christensen, Carsten; Andersen, C.R.; Pedersen, Erik Vesterlund; Egginton, Paul Nicholas; Hansen, Ole; Petersen, Jon Wulff.
In: Thin Solid Films, Vol. 294, No. 1-2, 1997, p. 72-75.Publication: Research - peer-review › Journal article – Annual report year: 1997
- Published
Dislocation patterning-a new tool for spatial manipulation of Ge islands. / Shiryaev, S.Y.; Pedersen, Erik Vesterlund; Jensen, Flemming; Petersen, Jon Wulff; Hansen, J.L.; Larsen, Nylandsted Arne.
In: Thin Solid Films, Vol. 294, 1997, p. 311-314.Publication: Research - peer-review › Journal article – Annual report year: 1997
- 1996
- Published
Chirality effects on 2D phase transitions. / Scalas, E.; Brezesinski, G.; Möhwald, H.; Kaganer, V.M.; Bouwman, W.G.; Kjær, K.
In: Thin Solid Films, Vol. 285, 1996, p. 56-61.Publication: Research › Journal article – Annual report year: 1996