Progress in Biomedical Optics and Imaging

ISSNs: 1605-7422, 0277-786X, 0277-786X, 0361-0748, 0277-786X

ISSNs (Electronic): 1042-4687

S P I E - International Society for Optical Engineering, United States

ISI indexed (2013): no, FI (2013): 1

Central database

Journal

  1. Research › Journal article
  2. Published
  3. Published

    Application of an EMCCD camera for calibration of hard X-ray telescopes. / Vogel, Julia K.; Pivovaro, Michael J.; Craig, William W.; Nagarkar, Vivek V.; Kudrolli, Haris; Madsen, Kristin Kruse; Koglin, Jason E.; Hailey, Charles J.; Christensen, Finn Erland; Brejnholt, Nicolai.

    In: Proceedings of SPIE, the International Society for Optical Engineering, Vol. 8443, 2012, p. 84432L.

    Publication: Research - peer-reviewJournal article – Annual report year: 2012

  4. Published

    A three-dimensional CZT detector as a focal plane prototype for a Laue Lens telescope. / Caroli, E.; Auricchio, N.; Budtz-Jørgensen, Carl; Curado da Silva, R.M.; Del Sordo, S.; Donati, A.; Kuvvetli, Irfan; Natalucci, L.; Quadrini, E.M.; Stephen, J.B.; Ventura, G.; Zappettini, A.

    In: Proceedings of SPIE, the International Society for Optical Engineering, Vol. 7011, No. 70113G, 2008.

    Publication: Research - peer-reviewJournal article – Annual report year: 2008

  5. Published

    Coating of silicon pore optics. / Cooper-Jensen, Carsten P.; Ackermann, M.; Christensen, Finn Erland; Collon, M. J.; Krumrey, M.

    In: Proceedings of SPIE, the International Society for Optical Engineering, Vol. 7437, No. 743713, 2009.

    Publication: Research - peer-reviewJournal article – Annual report year: 2009

  6. Published
  7. Published

    ESA-led ATHENA/IXO optics development status. / Bavdaz, Marcos; Rando, Nicola; Wille, Eric; Wallace, Kotska; Shortt, Brian; Collon, Maximilien; van Baren, Coen; Pareschi, Giovanni; Christensen, Finn Erland; Krumrey, Michael; Freyberg, Michael.

    In: Proceedings of SPIE, the International Society for Optical Engineering, Vol. 8147, No. 1, 2011, p. 81470C.

    Publication: Research - peer-reviewJournal article – Annual report year: 2011

  8. Published

    Evaluation of epoxy for use on NuSTAR optics. / An, H.; Christensen, Finn Erland; Doll, M.; Hailey, C. J.; Cooper-Jensen, Carsten P.; Koglin, J. E.; Mori, K.; Tajiri, G.

    In: Proceedings of SPIE, the International Society for Optical Engineering, Vol. 7437, No. 74371J, 2009.

    Publication: Research - peer-reviewJournal article – Annual report year: 2009

  9. Published
  10. Published
  11. Published

    LOFT - The large observatory for x-ray timing. / Feroci, M.; Den Herder, J.W.; Argan, A.; Campana, R.; Del Monte, E.; De Rosa, A.; Donnarumma, I.; Muleri, F.; Rapisarda, M.; Soffitta, P.; Trois, A.; In't Zand, J.J.M.; Kuiper, L.M.; Bozzo, E.; Azzarello, P.; Courvoisier, T.; Ferrigno, C.; Manousakis, A.; Tramacere, A.; Alpar, A.; Van Der Klis, M.; Watts, A.; Altamirano, D.; Uttley, P.; Wijers, R.; Wijnands, R.; Hernanz, M.; Alvarez, L.; Caliandro, G.A.; Sanchez, J.L. Galvez; Isern, J.; Karelin, D.; Papitto, A.; Rea, N.; Sala, G.; Tolos, L.; Amati, L.; Fuschino, F.; Marisaldi, M.; Orlandini, M.; Barret, D.; Amoros, C.; Cros, A.; Lin, D.; Rambaud, D.; Webb, N.; Andersson, N.; Antonelli, A.; D'Elia, V.; Gendre, B.; Giommi, P.; Stratta, G.; Balman, S.; Barbera, M.; D'Aí, A.; Di SalvoT.; Belloni, T.; Campana, S.; Motta, S.; Ahangarianabhari, M.; Bertuccio, G.; Bodin, P.; Macera, D.; Bianchini, A.; Tamburini, F.; Bidaud, J.-M. Bonnet; Götz, D.; Gouiffes, C.; Portel, J.; Rodriguez, J.; Schanne, S.; Santangelo, A.; Boutloukos, S.; Diebold, S.; Klochkov, D.; Kokkotas, K.; Labanti, C.; Maier, D.; Oze, F.; Perinati, E.; Suchy, S.; Sulemainov, V.; Tenzer, C.; Uter, P.; Wende, H.; Braga, J.; Rodríguez-Gi, P.; Brandt, Søren; Budtz-Jørgensen, Carl; Chenevez, Jérôme; Hansen, Flemming; Hornstrup, Allan; Kuvvetli, Irfan; Lund, Niels; Migliari, S.; Miller, J.M.; Bucciantini, N.; Burderi, L.; Bursa, M.; Hudec, R.; Karas, V.; Sochora, V.; Fabian, A.; Pohl, M.; Cadoux, F.R.; Favre, Y.; Cais, P.; Stella, L.; Casella, P.; Israel, G.; Chakrabarty, D.; Homan, J.; Nowak, M.; Remillard, R.; Weinberg, N.; Zane, S.; Coker, J.; Kataria, D.; Kennedy, T.; Linder, D.; Mignani, R.; Smith, A.; Smith, P.J.; Walton, D.; Winter, B.; Artigue, R.; Cumming, A.; De Martino, D.; Drago, A.; Guidorzi, C.; Durant, M.; Falanga, M.; Feldman, C.; Fraser, G.W.; Martindale, A.; O'Brien, P.; Osborne, J.P.; Vaughan, S.; Finger, M.H.; Galloway, D.K.; Heger, A.; Cole, R.; Giles, A.B.; Gilfanov, M.; Di Cosimo, S.; Groot, P.; Hartmann, D.H.; Haswell, C.A.; Norton, A.J.; Wilson-Hodge, C.A.; Huovelin, J.; Korpela, S.; Ingram, A.; Izzo, L.; Evangelista, Y.; Brown, E.; Kaaret, P.; Keek, L.; Kluzniak, W.; Zdziarski, A.; Kouveliotou, C.; Lai, D.; Lamb, F.K.; Lodato, G.; Longo, F.; Grassi, M.; Malcovati, P.; Cusumano, G.; Mangano, V.; Mineo, T.; Romano, P.; Stelzer, B.; Vercellone, S.; Smith, D.M.; Bianchi, S.; Matt, G.; Melatos, A.; Mendez, M.; Sanna, A.; Soleri, P.; Gezari, S.; Miller, M.C.; Reynolds, C.; Aranda, M. Reina; Sabau-Graziati, L.; Morsink, S.; Motch, C.; Mouchet, M.; Garcia-Berro, E.; Orleanski, P.; Wawrzaszek, R.; Osten, R.; Psaltis, D.; Paul, B.; Hudec, R.; Petracek, V.; Poutanen, J.; Zampa, N.; Pacciani, L.; Ramsay, G.; Rachevski, A.; Vacchi, A.; Zampa, G.; Ray, P.S.; Wood, K.; Jonker, P.; Reddy, S.; Reig, P.; Haas, D.; Rossi, E.M.R.; Ryde, F.; Salvaterra, R.; Schee, J.; Stuchlik, Z.; Torok, G.; Wilms, J.; Kreykenbohm, I.; Schmid, C.; Wille, M.; Schwenk, A.; Schwope, A.D.; Shearer, A.; Stappers, B.; Stergioulas, N.; Strohmayer, T.E.; Takahashi, T.; Watanabe, S.; Torrejon, J.M.; Torres, D.F.; Vrba, V.; Wheatley, P.; Orio, M.; Zampieri, L.; Zhang, B.; Turriziani, S.; Giovannini, G.; Giroletti, M.; Orienti, M.; Baldazzi, G.; Rodríguez-Gi, P.; Goldwurm, A.; Lebrun, F.; Varniere, P.; Barbera, M.; Collura, A.; Emmanoulopoulos, D.; Maccarone, T.J.; McHardy, I.M.; Mignani, R.; Markowitz, A.; Reig, P.; Miniutti, G.; Orio, M.; Feroci, M.; Cackett, E.; Campana, R.; Del Monte, E.; Evangelista, Y.; Muleri, F.; Pacciani, L.; Rapisarda, M.; Seyler, J.-Y.

    In: Proceedings of SPIE, the International Society for Optical Engineering, Vol. 8443, 2012, p. 84432D.

    Publication: Research - peer-reviewJournal article – Annual report year: 2012

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